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Jesse Ramsden (1735-1800): London's Leading Scientific Instrument Maker
ISBN: 9780754661368 Termin realizacji zamówienia: ok. 18 dni roboczych. Jesse Ramsden was one of the most prominent manufacturers of scientific instruments in the latter half of the eighteenth century. This is the biography of Jesse Ramsden. It reconstructs his life and career and presents us with an account of the instrument trade in this period.
Jesse Ramsden was one of the most prominent manufacturers of scientific instruments in the latter half of the eighteenth century. This is the biograph...
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635,71 zł |
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Advances in Imaging and Electron Physics: Calculus of Finite Differences in Quantum Electrodynamics
ISBN: 9780120147717 / Angielski / Twarda / 312 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. In particular, the early work of H.F. Harmuth on Maxwell's equations, which was highly controversial at the time, formed a supplement to the series. This volume, unlike previous volumes in the series concentrates solely on the research of professors' Harmuth and Meffert. These studies raise important and fundamental questions concerning some of the basic areas of physics: electromagnetic theory and quantum mechanics. They deserve... Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. ... |
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915,92 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780120147724 / Angielski / Twarda / 315 str. Termin realizacji zamówienia: ok. 20 dni roboczych. The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored... The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagn... |
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915,92 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780120147762 / Angielski / Twarda / 276 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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915,92 zł |
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Advances in Imaging and Electron Physics: Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics
ISBN: 9780120147793 / Angielski / Twarda / 319 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
915,92 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780120147823 / Angielski / Twarda / 317 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
915,92 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780120147861 / Angielski / Twarda / 344 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
915,92 zł |
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Cellular Electron Microscopy
ISBN: 9780123706478 / Angielski / Twarda / 850 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its description of three-dimensional detail. Cellular Electron Microscopy will help biologists from many disciplines understand modern EM and the value it might bring to their own work. The book's five sections deal with all major issues in EM of cells: specimen preparation, imaging in 3-D, imaging and understanding frozen-hydrated samples, labeling macromolecules, and analyzing EM data. Each chapter was written by scientists who are among...
Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its...
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cena:
621,97 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780123739070 / Angielski / Twarda / 240 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
915,92 zł |
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Advances in Imaging and Electron Physics, Volume 147
ISBN: 9780123739094 / Angielski / Twarda / 209 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
915,92 zł |
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Advances in Imaging and Electron Physics, Volume 148
ISBN: 9780123739100 / Angielski / Twarda / 264 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
915,92 zł |
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Advances in Imaging and Electron Physics: Electron Emission Physics
ISBN: 9780123742070 / Angielski / Twarda / 338 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin...
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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1022,81 zł |
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Advances in Imaging and Electron Physics, Volume 150
ISBN: 9780123742179 / Angielski / Twarda / 262 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor...
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
915,92 zł |
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High-Resolution Transmission Electron Microscopy: And Associated Techniques
ISBN: 9780195042757 / Angielski / Twarda / 668 str. Termin realizacji zamówienia: ok. 22 dni roboczych. This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled...
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, ener...
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2183,46 zł |
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Monte Carlo Modeling for Electron Microscopy and Microanalysis
ISBN: 9780195088748 / Angielski / Twarda / 224 str. Termin realizacji zamówienia: ok. 22 dni roboczych. This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the...
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for...
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1723,72 zł |
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Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications
ISBN: 9780471248248 / Angielski / Twarda / 516 str. Termin realizacji zamówienia: ok. 8-12 dni roboczych. Scanning, tunnelling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. This work covers the fundamental concepts of STM theory, operation, instrumentation and techniques for various applications. It introduces the novice practitioner to the fundamentals, whilst providing experts with a consolidated collection of principles and references.
Scanning, tunnelling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. This work covers the fundamental conce...
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1059,26 zł |
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Electron Microscopy and Analysis, Third Edition
ISBN: 9780748409686 / Angielski / Miękka / 264 str. Termin realizacji zamówienia: ok. 18 dni roboczych. Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for...
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially...
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325,94 zł |
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Quantitative Microbeam Analysis
ISBN: 9780750302562 / Angielski / Twarda / 350 str. Termin realizacji zamówienia: ok. 18 dni roboczych. Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The...
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used t...
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1448,08 zł |
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Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
ISBN: 9780750309677 / Angielski / Twarda / 492 str. Termin realizacji zamówienia: ok. 18 dni roboczych. Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the pr...
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1168,83 zł |
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Applications of Scanned Probe Microscopy to Polymers
ISBN: 9780841238831 / Angielski / Twarda / 284 str. Termin realizacji zamówienia: ok. 22 dni roboczych. Applications of Scanned Probe Microscopy to Polymers stresses the analysis of polymer and biopolymer surfaces using the ever-expanding methodologies of scanned probe microscopies. This book includes studies of optical properties by near-field methodologies, local mechanical properties of polymer films by AFM, the dynamics and mechanics of single molecules probed by AFM, and methodologies for enhanced imaging modes. A primary focus of this book is the quantitative measurement of surface properties by scanned probe techniques, which illustrates how the field has evolved and what new...
Applications of Scanned Probe Microscopy to Polymers stresses the analysis of polymer and biopolymer surfaces using the ever-expanding method...
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cena:
1601,12 zł |
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