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Advances in Imaging and Electron Physics
ISBN: 9780120147823 / Angielski / Twarda / 317 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
917,41 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780120147861 / Angielski / Twarda / 344 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
917,41 zł |
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Cellular Electron Microscopy
ISBN: 9780123706478 / Angielski / Twarda / 850 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its description of three-dimensional detail. Cellular Electron Microscopy will help biologists from many disciplines understand modern EM and the value it might bring to their own work. The book's five sections deal with all major issues in EM of cells: specimen preparation, imaging in 3-D, imaging and understanding frozen-hydrated samples, labeling macromolecules, and analyzing EM data. Each chapter was written by scientists who are among...
Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its...
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cena:
620,59 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780123739100 / Angielski / Twarda / 264 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
917,41 zł |
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Advances in Imaging and Electron Physics : Electron Emission Physics
ISBN: 9780123742070 / Angielski / Twarda / 338 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin...
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
1025,34 zł |
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High-Resolution Transmission Electron Microscopy and Associated Techniques
ISBN: 9780195042757 / Angielski / Twarda / 670 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled...
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, ener...
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cena:
2807,09 zł |
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Monte Carlo Modeling for Electron Microscopy and Microanalysis
ISBN: 9780195088748 / Angielski / Twarda / 224 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the...
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for...
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cena:
2227,62 zł |
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Electron Tomography : Methods for Three-Dimensional Visualization of Structures in the Cell
ISBN: 9780387312347 / Angielski / Twarda / 456 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series, with special emphasis on the problems presented by limitations of data collection in the transmission electron microscope. In addition to chapters that are applicable to 3D reconstruction in all fields of science, such as radiological imaging in medicine and electron tomography in materials science,... Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive w... |
cena:
977,07 zł |
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Biological Low-Voltage Scanning Electron Microscopy
ISBN: 9780387729701 / Angielski / Twarda / 344 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscope provides narrower probing beams and high electron energy. The result is improved spatial resolution and minimized sample charging and damage. Images produced are less destroyed and have a spatial resolution down to 1.5 nm, three to six times better than conventional SEM. Although this imaging technique has undergone tremendous developments, it is still poorly... Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-em... |
cena:
849,62 zł |
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Scanning Probe Microscopy and Spectroscopy : Theory, Techniques, and Applications
ISBN: 9780471248248 / Angielski / Twarda / 512 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Scanning, tunnelling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. This work covers the fundamental concepts of STM theory, operation, instrumentation and techniques for various applications. It introduces the novice practitioner to the fundamentals, whilst providing experts with a consolidated collection of principles and references.
Scanning, tunnelling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. This work covers the fundamental conce...
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cena:
1124,74 zł |
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Electron Microscopy and Analysis
ISBN: 9780748409686 / Angielski / Miękka / 264 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for...
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially...
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cena:
391,90 zł |
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Quantitative Microbeam Analysis
ISBN: 9780750302562 / Angielski / Twarda / 350 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The...
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used t...
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cena:
620,59 zł |
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Electron Microscopy and Analysis 2003 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
ISBN: 9780750309677 / Angielski / Twarda / 279 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the pr...
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cena:
1241,19 zł |
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Organic Nanophotonics
ISBN: 9781402012792 / Angielski / Twarda / 502 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Photonics concerns the generation, transport, processing and detection of light. It underlies a large amount of industrial activity, mainly devoted to information technology, telecommunications, environmental monitoring, biomedical science and instrumentation. The field has received a powerful impetus recently with the introduction of nanoscale concepts. Moreover, organic materials now appear as key components in photonic devices such as light-emitting diodes, integrated lasers, or photovoltaic cells. Organic molecular systems offer unique opportunities in nanophotonics since both... Photonics concerns the generation, transport, processing and detection of light. It underlies a large amount of industrial activity, mainly devoted... |
cena:
1185,27 zł |
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Organic Nanophotonics
ISBN: 9781402012808 / Angielski / Miękka / 502 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Photonics concerns the generation, transport, processing and detection of light. It underlies a large amount of industrial activity, mainly devoted to information technology, telecommunications, environmental monitoring, biomedical science and instrumentation. The field has received a powerful impetus recently with the introduction of nanoscale concepts. Moreover, organic materials now appear as key components in photonic devices such as light-emitting diodes, integrated lasers, or photovoltaic cells. Organic molecular systems offer unique opportunities in nanophotonics since both... Photonics concerns the generation, transport, processing and detection of light. It underlies a large amount of industrial activity, mainly devoted... |
cena:
552,24 zł |
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Electron Microscopy of Polymers
ISBN: 9783540363507 / Angielski / Twarda / 496 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented. The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General ... |
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594,72 zł |
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Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
ISBN: 9783540639763 / Angielski / Twarda / 529 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The diffe...
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cena:
1062,03 zł |
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Scanning Tunneling Microscopy and Its Application
ISBN: 9783540657156 / Angielski / Twarda / 370 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It...
Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM, and its many derivatives. A thor...
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cena:
849,62 zł |
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Advances in Imaging and Electron Physics
ISBN: 9780123742186 / Angielski / Twarda / 424 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
An important feature of these Advances is that the subjects are written in such a way that they can... Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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cena:
917,41 zł |
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Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM
ISBN: 9780387258003 / Angielski / Twarda / 202 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron... Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, ... |
cena:
555,81 zł |
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