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Kategorie szczegółowe BISAC
 Monte Carlo Modeling for Electron Microscopy and Microanalysis David C. Joy 9780195088748 Oxford University Press, USA
Monte Carlo Modeling for Electron Microscopy and Microanalysis

David C. Joy
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the...
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for...
cena: 814,99 zł
 Principles of Analytical Electron Microscopy Alton D. Jr. Romig David C. Joy Joseph Goldstein 9780306423871 Springer
Principles of Analytical Electron Microscopy

Alton D. Jr. Romig David C. Joy Joseph Goldstein
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the...
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analyt...
cena: 605,23 zł
 Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Goldstein, Joseph 9781461349693 Springer
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Goldstein, Joseph

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting...

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray...

cena: 443,82 zł
 Helium Ion Microscopy: Principles and Applications Joy, David C. 9781461486596 Springer
Helium Ion Microscopy: Principles and Applications

Joy, David C.

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced...

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscop...

cena: 201,72 zł
 Principles of Analytical Electron Microscopy Joseph Goldstein David C. Joy Alton D. Romi 9781489920393 Springer
Principles of Analytical Electron Microscopy

Joseph Goldstein David C. Joy Alton D. Romi
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the...
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analyt...
cena: 605,23 zł
 Introduction to Electron Holography Edgar Volkl Lawrence F. Allard David C. Joy 9781461371830 Springer
Introduction to Electron Holography

Edgar Volkl Lawrence F. Allard David C. Joy
Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's how to' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A complete bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences round out the volume's coverage.
Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in...
cena: 403,47 zł


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