wyszukanych pozycji: 5
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Delay Fault Testing for VLSI Circuits
ISBN: 9780792382959 / Angielski / Twarda / 1998 / 191 str. Termin realizacji zamówienia: ok. 20 dni roboczych. In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test...
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal suffi...
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cena:
575,62 zł |
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Unified Methods for VLSI Simulation and Test Generation
ISBN: 9780792390251 / Angielski / Twarda / 1989 / 148 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
cena:
383,73 zł |
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Efficient Test Methodologies for High-Speed Serial Links
ISBN: 9789048134427 / Angielski / Twarda / 2009 / 98 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques. Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high... |
cena:
518,06 zł |
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Design, Automation, and Test for Low-Power and Reliable Flexible Electronics
ISBN: 9781601988409 / Angielski / Miękka / 2014 / 128 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. Design, Automation, and Test for Low-Power and Reliable Flexible Electronics provides an in-depth overview of flexible electronics from their applications, manufacturing processes, device characteristics, to circuit and system design solutions. With rapid advances in flexible semiconducting materials, the performance of TFT circuits has been improving significantly and concerns about their ambient stability have been alleviated to a great extent over the past few years. After a brief introduction to flexible electronics, the book highlights its key difference from silicon electronics, and the...
Design, Automation, and Test for Low-Power and Reliable Flexible Electronics provides an in-depth overview of flexible electronics from their applicat...
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cena:
394,84 zł |
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Formal Equivalence Checking and Design Debugging
ISBN: 9780792381846 / Angielski / Twarda / 1998 / 229 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Some novel approaches to the problems of verifying design revisions after intensive sequential transformations such as retiming are described in detail.
The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and... Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugg...
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cena:
690,75 zł |