Kategoria BISAC: Technology & Engineering >> Electronics - Circuits - General

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Of particular interest to electrical engineers involved with designing...

The editors and authors present a wealth of knowledge regarding the most relevant aspects in the field of MOS transistor modeling.

The variety of subjects and the high quality of content of this volume make it a reference document for researchers and users of MOSFET devices and models. The book can be recommended to everyone who is involved in compact model developments, numerical TCAD modeling, parameter extraction, space-level simulation or model standardization. The book will appeal equally to PhD students who want to understand the ins and outs of MOSFETs as well as to modeling...

In the deep sub-micron regime, the power consumption has become one of the most important issues for competitive design of digital circuits. Due to dramatically increasing leakage currents, the power consumption does not take advantage of technology scaling as before. State-of-art power reduction techniques like the use of multiple supply and threshold voltages, transistor stack forcing and power gating are discussed with respect to implementation and power saving capability. Focus is given especially on technology dependencies, process variations and technology scaling. Design and...

Positive and sum-of-squares polynomials have received a special interest in the latest decade, due to their connections with semidefinite programming. Thus, efficient optimization methods can be employed to solve diverse problems involving polynomials. This book gathers the main recent results on positive trigonometric polynomials within a unitary framework; the theoretical results are obtained partly from the general theory of real polynomials, partly from self-sustained developments. The optimization applications cover a field different from that of real polynomials, mainly in signal...

Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, mask planning, simulation and manufacturing, and through statistical design and statistical timing closure of the design. It alerts the designer to the...

This book is the latest contribution to the Chip Design Languages series and it consists of selected papers presented at the Forum on Specifications and Design Languages (FDL'06), in September 2006. The book represents the state-of-the-art in research and practice, and it identifies new research directions. It highlights the role of specification and modelling languages, and presents practical experiences with specification and modelling languages.