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Reviews in Fluorescence 2009
ISBN: 9781441996718 / Angielski / Twarda / 392 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Reviews in Fluorescence 2009, the sixth volume of the book serial from Springer, serves as a comprehensive collection of current trends and emerging hot topics in the field of fluorescence and closely related disciplines. It summarizes the year's progress in fluorescence and its applications, with authoritative analytical reviews specialized enough to be attractive to professional researchers, yet also appealing to the wider audience of scientists in related disciplines of fluorescence. Reviews in Fluorescence offers an essential reference material for any lab working... Reviews in Fluorescence 2009, the sixth volume of the book serial from Springer, serves as a comprehensive collection of current trends and emer... |
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765,72 zł |
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Transmission Electron Microscopy: Physics of Image Formation
ISBN: 9781441923080 / Angielski / Miękka / 590 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from...
The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- t...
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689,15 zł |
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
ISBN: 9783642083723 / Angielski / Miękka / 529 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The diffe...
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1148,61 zł |
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 168
ISBN: 9780123859839 / Angielski / Twarda / 373 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances i...
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933,66 zł |
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Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis
ISBN: 9781848167896 / Angielski / Twarda / 616 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a tex...
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1011,47 zł |
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Scanning Microscopy: Symposium Proceedings
ISBN: 9783642848124 / Angielski / Miękka / 207 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. With the invention of the scanning tunneling microscope in 1982 by Binnig and Rohrer and the subsequent award of the Nobel Prize, the field of scan ning microscopy was given a strong boost in view of its wide range of ap plications. In particular, expanding the capability to access nature's foundations at the atomic level is now recognized as having the potential for major impact in Infonnation Technology. This third volume of the ESPRIT Basic Research Series provides a well structured overview of the state of the art of scanning microscopy and re cent advances including results of ESPRIT...
With the invention of the scanning tunneling microscope in 1982 by Binnig and Rohrer and the subsequent award of the Nobel Prize, the field of scan ni...
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382,84 zł |
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Advances in Imaging and Electron Physics: Volume 180
ISBN: 9780124077553 / Angielski / Twarda / 224 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance... |
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772,86 zł |
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Advances in Imaging and Electron Physics: Volume 169
ISBN: 9780123859815 / Angielski / Twarda / 251 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances i...
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cena:
933,66 zł |
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Advances in Imaging and Electron Physics: Volume 179
ISBN: 9780124077003 / Angielski / Twarda / 410 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), ...
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cena:
772,86 zł |
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Biomedical Electron Microscopy: Illustrated Methods and Interpretations
ISBN: 9780124806108 / Angielski / Twarda / 548 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This comprehensive reference illustrates optimal preparation methods in biological electron microscopy compared with common methodological problems. Not only will the basic methodologies of transmission electron microscopy like fixation, microtomy, and microscopy be presented, but the authors also endeavor to illustrate more specialized techniques such as negative staining, autoradiography, cytochemistry, immunoelectron microscopy, and computer-assisted image analysis.
This comprehensive reference illustrates optimal preparation methods in biological electron microscopy compared with common methodological problems. N...
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534,26 zł |
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 9780387857305 / Angielski / Twarda / 332 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope & x-ray microanalyzer. Specimens range from inorganic, organic, biological, & geological samples to materials such as metals, polymers, & semiconductors which can exist as solids, liquids, & gases.
This handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope & x-ray microanalyzer. Specimens range...
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535,99 zł |
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Digital Imaging Detectors For Electron Microscopy
ISBN: 9781848162853 / Angielski Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. This book discusses theoretical, technological and functional aspects of electron detectors. It is suitable for researchers in electron microscopy.
Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. This book discusse...
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290,47 zł |
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Scanning Probe Microscopy for Energy Research
ISBN: 9789814434706 / Angielski / Twarda / 640 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality...
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the co...
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cena:
1037,40 zł |
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Examining the Submicron World
ISBN: 9781461292975 / Angielski / Miękka / 372 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. An Institute like ours cannot help but lend credence to the notion of the late Derek J. de Solla Price of Yale University that "the scientific revolution was largely the improvement, invention and use of a series of instruments . . . . that expanded the reach of science in innumerable directions." Most of science today and in years gone by depends on the experimental observation of struc ture on the small scale with microscopes, and on the large scale with telescopes. The first instruments to expand the observational range of the human eye were simple optical systems, designed in the case of...
An Institute like ours cannot help but lend credence to the notion of the late Derek J. de Solla Price of Yale University that "the scientific revolut...
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191,40 zł |
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Biological Electron Microscopy: Theory, Techniques, and Troubleshooting
ISBN: 9781461348566 / Angielski / Miękka / 534 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, light microscopy, physiology, and biochemistry, among other disciplines. It is also presented as a technically demanding discipline operating largely in the sphere of "black boxes" and governed by many absolute laws of procedure. At the introductory level, this portrayal does the discipline and the student a disservice. The instrumentation we use is complex, but ultimately understandable and, more importantly, repairable. The procedures we employ for preparing tissues and cells are...
Electron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, light microscopy, physiology, and bio...
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cena:
459,42 zł |
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Reviews in Fluorescence 2009
ISBN: 9781461429944 / Angielski / Miękka / 392 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Reviews in Fluorescence 2009, the sixth volume of the book serial from Springer, serves as a comprehensive collection of current trends and emerging hot topics in the field of fluorescence and closely related disciplines. It summarizes the year's progress in fluorescence and its applications, with authoritative analytical reviews specialized enough to be attractive to professional researchers, yet also appealing to the wider audience of scientists in related disciplines of fluorescence. Reviews in Fluorescence offers an essential reference material for any lab working... Reviews in Fluorescence 2009, the sixth volume of the book serial from Springer, serves as a comprehensive collection of current trends and emer... |
cena:
765,72 zł |
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Atomic Force Microscopy/Scanning Tunneling Microscopy 2
ISBN: 9781475793277 / Angielski / Miękka / 250 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the...
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held...
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cena:
574,29 zł |
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Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 9781475781847 / Angielski / Miękka / 210 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry,...
The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning...
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cena:
506,04 zł |
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Advances in Imaging and Electron Physics: Volume 183
ISBN: 9780128002650 / Angielski / Twarda / 254 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Op...
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cena:
772,86 zł |
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Advances in Imaging and Electron Physics: Volume 181
ISBN: 9780128000915 / Angielski / Twarda / 240 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance... |
cena:
772,86 zł |
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