• Wyszukiwanie zaawansowane
  • Kategorie
  • Kategorie BISAC
  • Książki na zamówienie
  • Promocje
  • Granty
  • Książka na prezent
  • Opinie
  • Pomoc
  • Załóż konto
  • Zaloguj się

 » książki  » Science - Electron Microscopes & Microscopy

zaloguj się | załóż konto
Logo Krainaksiazek.pl

koszyk

konto

szukaj
topmenu
Księgarnia internetowa
Szukaj
Książki na zamówienie
Promocje
Granty
Książka na prezent
Moje konto
Pomoc
 
 
Wyszukiwanie zaawansowane
Pusty koszyk
Bezpłatna dostawa dla zamówień powyżej 40 złBezpłatna dostawa dla zamówień powyżej 40 zł

Kategorie główne

• Nauka
 [2952531]
• Literatura piękna
 [1815254]

  więcej...
• Turystyka
 [52246]
• Informatyka
 [151406]
• Komiksy
 [36554]
• Encyklopedie
 [23115]
• Dziecięca
 [612095]
• Hobby
 [104900]
• AudioBooki
 [1784]
• Literatura faktu
 [191556]
• Muzyka CD
 [380]
• Słowniki
 [2946]
• Inne
 [442645]
• Kalendarze
 [1505]
• Podręczniki
 [166084]
• Poradniki
 [422936]
• Religia
 [506774]
• Czasopisma
 [518]
• Sport
 [60387]
• Sztuka
 [242639]
• CD, DVD, Video
 [3428]
• Technologie
 [219359]
• Zdrowie
 [98539]
• Książkowe Klimaty
 [124]
• Zabawki
 [2509]
• Puzzle, gry
 [3809]
• Literatura w języku ukraińskim
 [261]
• Art. papiernicze i szkolne
 [8058]
Kategorie szczegółowe BISAC

Kategoria BISAC: Science >> Electron Microscopes & Microscopy

ilość książek w kategorii: 266

Wyświetl książki:
Dostępne języki:
Cena:
od:
do:
ilość na stronie:


 Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers: Volume 192 Hawkes, Peter W. 9780128022528 Elsevier Science
Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers: Volume 192

ISBN: 9780128022528 / Angielski / Twarda / 224 str.

ISBN: 9780128022528/Angielski/Twarda/224 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the...

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advan...

cena: 844,48

 Particles and Waves in Electron Optics and Microscopy: Volume 194 Hawkes, Peter W. 9780128048146 Academic Press
Particles and Waves in Electron Optics and Microscopy: Volume 194

ISBN: 9780128048146 / Angielski / Twarda / 358 str.

ISBN: 9780128048146/Angielski/Twarda/358 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject...

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advance...

cena: 844,48

 Single-Molecule Microscopy and Spectroscopy: Faraday Discussion 184 Royal Society of Chemistry   9781782624615 Royal Society of Chemistry
Single-Molecule Microscopy and Spectroscopy: Faraday Discussion 184

ISBN: 9781782624615 / Angielski / Twarda / 494 str.

ISBN: 9781782624615/Angielski/Twarda/494 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Royal Society Of Chemistry
Since their inception, optical detection and spectroscopy of single molecules have steadily expanded to an amazing variety of disciplines in the natural sciences. Domains such as optical microscopy, quantum optics, nanophotonics and soft matter/ material science have all benefited from the new, "average-free" insights provided by the optical isolation of single molecules, quantum dots, metal nanoparticles, and other nanometre-sized objects. The techniques themselves have also made spectacular progress with developments in super-resolution microscopy, time-resolved measurements,...
Since their inception, optical detection and spectroscopy of single molecules have steadily expanded to an amazing variety of disciplines in the natur...
cena: 844,48

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780128048122 Academic Press
Advances in Imaging and Electron Physics

ISBN: 9780128048122 / Angielski / Twarda / 358 str.

ISBN: 9780128048122/Angielski/Twarda/358 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject...

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advance...

cena: 844,48

 Advances in Imaging and Electron Physics: Volume 158 Hawkes, Peter W. 9780123747693 ELSEVIER SCIENCE & TECHNOLOGY
Advances in Imaging and Electron Physics: Volume 158

ISBN: 9780123747693 / Angielski / Twarda / 241 str.

ISBN: 9780123747693/Angielski/Twarda/241 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Updated with contributions from leading international scholars and industry...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances i...
cena: 894,16

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162 Hawkes, Peter W. 9780123813169 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162

ISBN: 9780123813169 / Angielski / Twarda / 275 str.

ISBN: 9780123813169/Angielski/Twarda/275 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 894,16

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 163 Hawkes, Peter W. 9780123813145 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 163

ISBN: 9780123813145 / Angielski / Twarda / 228 str.

ISBN: 9780123813145/Angielski/Twarda/228 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances ...
cena: 894,16

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 161 Hawkes, Peter W. 9780123813183 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 161

ISBN: 9780123813183 / Angielski / Twarda / 288 str.

ISBN: 9780123813183/Angielski/Twarda/288 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 894,16

 Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166 Hawkes, Peter W. 9780123813107 Academic Press
Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166

ISBN: 9780123813107 / Angielski / Twarda / 752 str.

ISBN: 9780123813107/Angielski/Twarda/752 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 894,16

 Advances in Imaging and Electron Physics: Volume 160 Hawkes, Peter W. 9780123810175 Academic Press
Advances in Imaging and Electron Physics: Volume 160

ISBN: 9780123810175 / Angielski / Twarda / 296 str.

ISBN: 9780123810175/Angielski/Twarda/296 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 894,16

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 168 Hawkes, Peter W. 9780123859839 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 168

ISBN: 9780123859839 / Angielski / Twarda / 373 str.

ISBN: 9780123859839/Angielski/Twarda/373 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances i...
cena: 894,16

 Advances in Imaging and Electron Physics: Volume 169 Hawkes, Peter W. 9780123859815 0
Advances in Imaging and Electron Physics: Volume 169

ISBN: 9780123859815 / Angielski / Twarda / 251 str.

ISBN: 9780123859815/Angielski/Twarda/251 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W Hawkes
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances i...
cena: 894,16

 Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell Frank, Joachim 9780387312347 Springer
Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell

ISBN: 9780387312347 / Angielski / Twarda / 456 str.

ISBN: 9780387312347/Angielski/Twarda/456 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Joachim Frank

Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series, with special emphasis on the problems presented by limitations of data collection in the transmission electron microscope. In addition to chapters that are applicable to 3D reconstruction in all fields of science, such as radiological imaging in medicine and electron tomography in materials science,...

Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive w...

cena: 934,56

 Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell Frank, Joachim 9781441921727 Not Avail
Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell

ISBN: 9781441921727 / Angielski / Miękka / 456 str.

ISBN: 9781441921727/Angielski/Miękka/456 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Joachim Frank

Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series, with special emphasis on the problems presented by limitations of data collection in the transmission electron microscope. In addition to chapters that are applicable to 3D reconstruction in all fields of science, such as radiological imaging in medicine and electron tomography in materials science,...

Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive w...

cena: 934,56

 Reviews in Fluorescence 2005 Geddes, Chris D. 9780387236285 Springer
Reviews in Fluorescence 2005

ISBN: 9780387236285 / Angielski / Twarda / 444 str.

ISBN: 9780387236285/Angielski/Twarda/444 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Springer; Chris D. Geddes; Joseph R. Lakowicz
Last year we launched Volume 1 of the Reviews in Fluorescence series. The volume was well-received by the fluorescence community, with many e-mails and letters providing valuable feedback, we subsequently thank you all for your continued support. After the volume was published we were most pleased to learn that the volume is to be citable and indexed, appearing on the ISI database. Subsequently, as well as the series having an impact number in due course, individual chapters will appear on the database and be both citable and keyword searchable. We feel that this will be a powerful resource...
Last year we launched Volume 1 of the Reviews in Fluorescence series. The volume was well-received by the fluorescence community, with many e-mails an...
cena: 941,17

 Advances in Imaging and Electron Physics: Electron Emission Physics Volume 149 Jensen, Kevin 9780123742070 Academic Press
Advances in Imaging and Electron Physics: Electron Emission Physics Volume 149

ISBN: 9780123742070 / Angielski / Twarda / 338 str.

ISBN: 9780123742070/Angielski/Twarda/338 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin...

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
cena: 943,83

 Advances in Imaging and Electron Physics: Aberration-Corrected Electron Microscopy Volume 153 Hawkes, Peter W. 9780123742209 Academic Press
Advances in Imaging and Electron Physics: Aberration-Corrected Electron Microscopy Volume 153

ISBN: 9780123742209 / Angielski / Twarda / 538 str.

ISBN: 9780123742209/Angielski/Twarda/538 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the...
The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be see...
cena: 943,83

 Advances in Imaging and Electron Physics: Volume 139 Hawkes, Peter W. 9780120147816 Academic Press
Advances in Imaging and Electron Physics: Volume 139

ISBN: 9780120147816 / Angielski / Twarda / 306 str.

ISBN: 9780120147816/Angielski/Twarda/306 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
cena: 943,83

 Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis Tanaka, Nobuo 9781848167896 Imperial College Press
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis

ISBN: 9781848167896 / Angielski / Twarda / 616 str.

ISBN: 9781848167896/Angielski/Twarda/616 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Nobuo Tanaka
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a tex...
cena: 968,68

 Scanning Probe Microscopy for Energy Research Bonnell, Dawn 9789814434706 0
Scanning Probe Microscopy for Energy Research

ISBN: 9789814434706 / Angielski / Twarda / 640 str.

ISBN: 9789814434706/Angielski/Twarda/640 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Dawn A Bonnell
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality...
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the co...
cena: 993,51

Pierwsza Podprzednia  4  5  6  Następna Ostatnia

Facebook - konto krainaksiazek.pl



Opinie o Krainaksiazek.pl na Opineo.pl

Partner Mybenefit

Krainaksiazek.pl w programie rzetelna firma Krainaksiaze.pl - płatności przez paypal

Czytaj nas na:

Facebook - krainaksiazek.pl
  • książki na zamówienie
  • granty
  • książka na prezent
  • kontakt
  • pomoc
  • opinie
  • regulamin
  • polityka prywatności

Zobacz:

  • Księgarnia czeska

  • Wydawnictwo Książkowe Klimaty

1997-2026 DolnySlask.com Agencja Internetowa

© 1997-2022 krainaksiazek.pl
     
KONTAKT | REGULAMIN | POLITYKA PRYWATNOŚCI | USTAWIENIA PRYWATNOŚCI
Zobacz: Księgarnia Czeska | Wydawnictwo Książkowe Klimaty | Mapa strony | Lista autorów
KrainaKsiazek.PL - Księgarnia Internetowa
Polityka prywatnosci - link
Krainaksiazek.pl - płatnośc Przelewy24
Przechowalnia Przechowalnia