wyszukanych pozycji: 6
Noncontact Atomic Force Microscopy: Volume 3
ISBN: 9783319358765 / Angielski / Miękka / 2016 / 527 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
|
cena:
781,79 zł |
Roadmap of Scanning Probe Microscopy
ISBN: 9783540343141 / Angielski / Twarda / 2006 / 201 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future. Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future dev... |
|
cena:
586,33 zł |
Roadmap of Scanning Probe Microscopy
ISBN: 9783642070693 / Angielski / Miękka / 2010 / 201 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future. Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future dev... |
|
cena:
586,33 zł |
Noncontact Atomic Force Microscopy: Volume 3
ISBN: 9783319155876 / Angielski / Twarda / 2015 / 527 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications t...
|
|
cena:
781,79 zł |
Noncontact Atomic Force Microscopy: Volume 2
ISBN: 9783642260704 / Angielski / Miękka / 2012 / 401 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of... Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkab... |
|
cena:
859,97 zł |
Noncontact Atomic Force Microscopy: Volume 2
ISBN: 9783642014949 / Angielski / Twarda / 2009 / 401 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of... Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkab... |
|
cena:
859,97 zł |