Wyniki wyszukiwania:
wyszukanych pozycji: 11
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Scanning Probe Microscopy: Analytical Methods
ISBN: 9783642083600 / Angielski / Miękka / 2010 / 216 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning pr...
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cena:
578,30 zł |
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Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques
ISBN: 9783540585893 / Angielski / Miękka / 1995 / 349 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy,...
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad rang...
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cena:
192,74 zł |
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Scanning Probe Microscopy and Spectroscopy: Methods and Applications
ISBN: 9780521428477 / Angielski / Miękka / 1994 / 660 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunneling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, including topographic imaging, local tunneling barrier height measurements, tunneling spectroscopy, and local potentiometry. A treatment of the experimental techniques used in...
The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe ...
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cena:
311,50 zł |
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Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques
ISBN: 9783642973659 / Angielski / Miękka / 2012 / 308 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy,...
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applic...
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cena:
192,74 zł |
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Scanning Probe Microscopy: Analytical Methods
ISBN: 9783540638155 / Angielski / Twarda / 1998 / 216 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning pr...
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cena:
578,30 zł |
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Atomic- And Nanoscale Magnetism
ISBN: 9783319995571 / Angielski / Twarda / 2018 / 390 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
cena:
539,74 zł |
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Scanning Tunneling Microscopy III: Theory of STM and Related Scanning Probe Methods
ISBN: 9783540608240 / Angielski / Miękka / 1996 / 402 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the field of local probe methods.
In this second edition the text has been updated and new methods are discussed. Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related sc...
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cena:
385,52 zł |
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Scanning Probe Microscopy and Spectroscopy: Methods and Applications
ISBN: 9780521418102 / Angielski / Twarda / 1994 / 660 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunneling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, including topographic imaging, local tunneling barrier height measurements, tunneling spectroscopy, and local potentiometry. A treatment of the experimental techniques used in...
The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe ...
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cena:
690,66 zł |
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Noncontact Atomic Force Microscopy
ISBN: 9783540431176 / Angielski / Twarda / 2002 / 440 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the ...
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cena:
771,08 zł |
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Noncontact Atomic Force Microscopy: Volume 2
ISBN: 9783642014949 / Angielski / Twarda / 2009 / 401 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of... Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkab... |
cena:
848,19 zł |
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Noncontact Atomic Force Microscopy: Volume 2
ISBN: 9783642260704 / Angielski / Miękka / 2012 / 401 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of... Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkab... |
cena:
848,19 zł |
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