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This volume constitutes the proceedings of the 18th Conference on Applied Crystallography, held in Wisla, Poland, in September 2000. It contains research data from the structural investigation of materials of high industrial value.

This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.

This proceedings volume contains research data on structural investigation of materials of high industrial value. Topics discussed include: phase characterization by diffraction methods; application of direct methods for solving crystal structure from powder diffraction; electron crystallography; Rietveld method applications; defects and substructure analysis in materials; new x-ray methods; small-angle scattering studies of crystyalline and amorphous solids; phase transformation studies, including crystallography of the reversible martenistic transformation; structure of non-crystalline...