Applied Crystallography - Proceedings Of The Xvi Conference

ISBN-13: 9789810221539 / Angielski / Twarda / 1995 / 500 str.

Danuta Stroz;Henryk Morawiec

Opis

This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.