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This book aims to propagate the newest achievements of applied crystallography among crystallographers, solid state physicists and materials scientists. It presents application of structural studies to materials used in industrial practice rather than those associated with the crystal structure determination only.

This volume constitutes the proceedings of the 18th Conference on Applied Crystallography, held in Wisla, Poland, in September 2000. It contains research data from the structural investigation of materials of high industrial value.

This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.