Kategoria BISAC: Technology & Engineering >> Electronics - Circuits - General

Dynamic System Reconfiguration in Heterogeneous Platforms defines the MORPHEUS platform that can join the performance density advantage of reconfigurable technologies and the easy control capabilities of general purpose processors. It consists of a System-on-Chip made of a scalable system infrastructure hosting heterogeneous reconfigurable accelerators, providing dynamic reconfiguration capabilities and data-stream management capabilities.

Inductive powering has been a reliable and simple method for many years to wirelessly power devices over relatively short distances, from a few centimetres to a few feet. Examples are found in biomedical applications, such as cochlear implants; in RFID, such as smart cards for building access control; and in consumer devices, such as electrical toothbrushes. Device sizes shrunk considerably the past decades, demanding accurate design tools to obtain reliable link operation in demanding environments. With smaller coil sizes, the link efficiency drops dramatically to a point where the...

1V CMOS Gm-C Filters: Design and Applications discusses the design aspects of transconductor and Gm-C filter circuits, with a special focus on 1V circuit implementations. The emphasis is on high linearity voltage-to-current blocks for wireless and wireline applications, and the designs cover up to very high speed specifications.

1V CMOS Gm-C Filters: Design and Applications provides a clear introduction of low voltage architectures and yields insight into the influence of circuit non-idealities. The fully CMOS implementation could be useful for wireless and...

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed...

Nanosystems use new, nanoscopic electrical and/or mechanical devices which, as constituents of electronic and electromechanical systems, find application primarily in computing, embedded control and biomedical data acquisition. In particular, this book will deal with the characterization and patterning of these materials from an engineering perspective, with the objective of creating operational prototypes and products.

The book will integrate various nano technologies on materials, devices and systems and identify key areas and results. The book will describe different design...

This book is a unique combination of a basic guide to general analog circuit simulation and a SPICE OPUS software manual, which may be used as a textbook or self-study reference. The book is divided into three parts: mathematical theory of circuit analysis, a crash course on SPICE OPUS, and a complete SPICE OPUS reference guide. All simulations as well as the free simulator software may be directly downloaded from the SPICE OPUS homepage: www.spiceopus.si.

Circuit Simulation with SPICE OPUS is intended for a wide audience of undergraduate and graduate students,...

This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit...

Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as "the most thorough and concise treatment of the broad ESD continuum that is available." Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover:

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The purpose of the book is to provide researchers, PhD students, and undergraduate students a research monograph containing both fundamentals on the topics and advanced results that have been recently obtained. With about 60...

This practical book provides a step-by-step, interactive introduction to formal verification of systems and circuits. The book offers theoretical background and introduces the application of three powerful verification toolsets: LOTOS-based CADP, Petri nets-based PETRIFY, and CCS-based CWB. The book covers verification of modular asynchronous circuits, alternating-bit protocols, arbiters, pipeline controllers, up-down counters, and phase converters, as well as many other verification examples.

Using the given detailed examples,...

This book describes the theory, design and realization of dynamic offset compensated CMOS amplifiers. It focuses on the design of general-purpose broadband operational amplifiers and instrumentation amplifiers. It also introduces chopper offset stabilization.

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for...

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies....