This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Most up-to-date coverage of design for testability.
Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, i...
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for...
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elabo...
