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Transmission Electron Microscopy
ISBN: 9780387765020 / Angielski / Miękka / 775 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment. This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this... |
cena:
484,18 zł |
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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 9780521142304 / Angielski / Miękka / 212 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This 2005 book covers principles and techniques of EMPA and SEM for geological graduate students and postdoctoral workers.
This 2005 book covers principles and techniques of EMPA and SEM for geological graduate students and postdoctoral workers.
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cena:
292,69 zł |
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Transmission Electron Microscopy in Micro-Nanoelectronics
ISBN: 9781848213678 / Angielski / Twarda / 264 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs. Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the in... |
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677,76 zł |
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Scanning Electron Microscope Optics and Spectrometers
ISBN: 9789812836670 / Angielski / Twarda / 416 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Contains proposals to redesign the scanning electron microscope, so that it is compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. This book emphasizes the concepts underlying spectrometer designs in the scanning electron microscope.
Contains proposals to redesign the scanning electron microscope, so that it is compatible with other charged particle beam instrumentation and analyti...
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cena:
634,12 zł |
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Arctic Systems
ISBN: 9781468408010 / Angielski / Miękka / 956 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. For the purpose of publication of these Proceedings, the original conference programme has been rearranged to provide a more logical sequence of presentation. The beginning sections give the inaugural speech and the six keynote addresses which were delivered at the opening plenary session. Following these are the working papers, published more or less in the same sequence in which they were presented in the original programme. The order of presentation does not necessarily emphasise the importance of any one aspect of the Arctic Systems over others. The final reports of the six working groups...
For the purpose of publication of these Proceedings, the original conference programme has been rearranged to provide a more logical sequence of prese...
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cena:
201,72 zł |
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Biological Field Emission Scanning Electron Microscopy
ISBN: 9781118654064 / Angielski / Twarda / 752 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
790,46 zł |
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Advances in Imaging and Electron Physics: Volume 197
ISBN: 9780128048115 / Angielski / Twarda / 174 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advance... |
cena:
829,23 zł |
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
ISBN: 9781493939473 / Angielski / Miękka / 555 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to char...
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cena:
806,99 zł |
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Liquid Cell Electron Microscopy
ISBN: 9781107116573 / Angielski / Twarda / 524 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The first book on the topic, with each chapter written by pioneers in the field, this essential resource details the fundamental theory, applications, and future developments of liquid cell electron microscopy. This book describes the techniques that have been developed to image liquids in both transmission and scanning electron microscopes, including general strategies for examining liquids, closed and open cell electron microscopy, experimental design, resolution, and electron beam effects. A wealth of practical guidance is provided, and applications are described in areas such as...
The first book on the topic, with each chapter written by pioneers in the field, this essential resource details the fundamental theory, applications,...
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cena:
847,33 zł |
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Confocal Microscopy
ISBN: 9781681743363 / Angielski / Miękka / 90 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book...
The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users ...
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cena:
193,68 zł |
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Advances in Imaging and Electron Physics: Volume 205
ISBN: 9780128152171 / Angielski / Twarda / 286 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
824,34 zł |
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Advances in Imaging and Electron Physics: Volume 207
ISBN: 9780128152157 / Angielski / Twarda / 358 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
824,34 zł |
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Reminiscences of Ahmed H.Zewail: Photons, Electrons and What Else? - A Portrait from Close Range. Remembrances of His Group Members and Family
ISBN: 9789813231658 / Angielski / Miękka / 428 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
170,72 zł |
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Reminiscences of Ahmed H.Zewail: Photons, Electrons and What Else? - A Portrait from Close Range. Remembrances of His Group Members and Family
ISBN: 9789813231535 / Angielski / Twarda / 428 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
390,22 zł |
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The Brilliant Zewail
ISBN: 9789813275829 / Angielski / Twarda / 260 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
317,06 zł |
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The Brilliant Zewail
ISBN: 9789813276703 / Angielski / Miękka / 260 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
121,95 zł |
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Live Cell Imaging: Methods and Protocols
ISBN: 9781493961405 / Angielski / Miękka / 367 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
585,06 zł |
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The Smart A. S. S. for Your B. S.: The Psychology of Winning Big
ISBN: 9781633900554 / Angielski / Miękka / 282 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
80,66 zł |
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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
ISBN: 9780367402945 / Angielski / Miękka / 856 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
321,89 zł |
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Microscope Activities
ISBN: 9780897391191 / Angielski / Miękka / 44 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
cena:
64,34 zł |
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