Advances in Imaging and Electron Physics: Volume 205

ISBN-13: 9780128152171 / Angielski / Twarda / 2018 / 286 str.

Peter W. Hawkes

Spis treści

1. The Early Electron Microscopes, a Critical Study John van Gorkom, Dirk van Delft and Ton van Helvoort 2. Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools Erich Plies

O autorze

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.