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Kategoria BISAC: Science >> Electron Microscopes & Microscopy

ilość książek w kategorii: 267

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 Reviews in Fluorescence 2007, Volume 4 Geddes, Chris D. 9780387887210 Springer
Reviews in Fluorescence 2007, Volume 4

ISBN: 9780387887210 / Angielski / Twarda / 400 str.

ISBN: 9780387887210/Angielski/Twarda/400 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
C. D. Geddes
This is the fourth volume in the Reviews in Fluorescence series. To date, three volumes have been both published and well received by the scienti c community. Several book reviews in the last few years have also favorably remarked on the series. In this fourth volume we continue the tradition of publishing leading edge and timely articles from authors around the world. We thank the authors for their timely and exciting contributions. We hope you nd this volume as useful as past volumes, which promises to be just as diverse with regard to uorescence-based content. Finally, in closing, I would...
This is the fourth volume in the Reviews in Fluorescence series. To date, three volumes have been both published and well received by the scienti c co...
cena: 605,23 zł

 4D Electron Microscopy: Imaging in Space and Time Zewail, Ahmed H. 9781848164000 Imperial College Press
4D Electron Microscopy: Imaging in Space and Time

ISBN: 9781848164000 / Angielski / Miękka / 360 str.

ISBN: 9781848164000/Angielski/Miękka/360 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Ahmed H. Zewail; John M. Thomas
The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. It is also poised to contribute much new spatially-resolved and time-resolved insights of central importance in the exploration of most aspects of condensed matter, ranging from the physical to the biological sciences.Whereas in all conventional EM methods, imaging, diffraction, and chemical analyses have been conducted in a static...
The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowl...
cena: 194,71 zł

 4D Electron Microscopy: Imaging in Space and Time Zewail, Ahmed H. 9781848163904 Imperial College Press
4D Electron Microscopy: Imaging in Space and Time

ISBN: 9781848163904 / Angielski / Twarda / 360 str.

ISBN: 9781848163904/Angielski/Twarda/360 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Ahmed H. Zewail; John M. Thomas
The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. It is also poised to contribute much new spatially-resolved and time-resolved insights of central importance in the exploration of most aspects of condensed matter, ranging from the physical to the biological sciences.Whereas in all conventional EM methods, imaging, diffraction, and chemical analyses have been conducted in a static...
The modern electron microscope, as a result of recent revolutionary developments and many evolutionary ones, now yields a wealth of quantitative knowl...
cena: 559,80 zł

 Advances in Imaging and Electron Physics: Volume 158 Hawkes, Peter W. 9780123747693 ELSEVIER SCIENCE & TECHNOLOGY
Advances in Imaging and Electron Physics: Volume 158

ISBN: 9780123747693 / Angielski / Twarda / 241 str.

ISBN: 9780123747693/Angielski/Twarda/241 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Updated with contributions from leading international scholars and industry...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances i...
cena: 876,20 zł

 Reviews in Fluorescence, Volume 5 Geddes, Chris D. 9781441908285 Springer
Reviews in Fluorescence, Volume 5

ISBN: 9781441908285 / Angielski / Twarda / 490 str.

ISBN: 9781441908285/Angielski/Twarda/490 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Chris D. Geddes
This is the ?fth volume in the Reviews in Fluorescence series. To date, four previous volumes have been both published and well received by the scienti?c community. Several book reviews in the last few years have also favorably remarked on the series. In this ?fth volume we continue the tradition of publishing leading edge and timely articles from authors around the world. With the recent Nobel Prize in Chemistry for 2008 being awarded for the discovery and development of the Green Fluorescent Protein (GFP) to Shimomura, Chal?e, and Tsien, we have subsequently included several timely reviews...
This is the ?fth volume in the Reviews in Fluorescence series. To date, four previous volumes have been both published and well received by the scient...
cena: 806,99 zł

 Progress in Transmission Electron Microscopy 2: Applications in Materials Science Zhang, Xiao-Feng 9783540676812 SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH &
Progress in Transmission Electron Microscopy 2: Applications in Materials Science

ISBN: 9783540676812 / Angielski / Twarda / 307 str.

ISBN: 9783540676812/Angielski/Twarda/307 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular...
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and i...
cena: 403,47 zł

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162 Hawkes, Peter W. 9780123813169 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162

ISBN: 9780123813169 / Angielski / Twarda / 275 str.

ISBN: 9780123813169/Angielski/Twarda/275 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 876,20 zł

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 163 Hawkes, Peter W. 9780123813145 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 163

ISBN: 9780123813145 / Angielski / Twarda / 228 str.

ISBN: 9780123813145/Angielski/Twarda/228 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances ...
cena: 876,20 zł

 Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 161 Hawkes, Peter W. 9780123813183 Academic Press
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 161

ISBN: 9780123813183 / Angielski / Twarda / 288 str.

ISBN: 9780123813183/Angielski/Twarda/288 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 876,20 zł

 Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166 Hawkes, Peter W. 9780123813107 Academic Press
Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166

ISBN: 9780123813107 / Angielski / Twarda / 752 str.

ISBN: 9780123813107/Angielski/Twarda/752 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 876,20 zł

 Advances in Imaging and Electron Physics: Volume 160 Hawkes, Peter W. 9780123810175 Academic Press
Advances in Imaging and Electron Physics: Volume 160

ISBN: 9780123810175 / Angielski / Twarda / 296 str.

ISBN: 9780123810175/Angielski/Twarda/296 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading international scholars and industry...

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advance...

cena: 876,20 zł

 Advances in Imaging & Electron Physics Hawkes, Peter W. 9780120147649 Academic Press
Advances in Imaging & Electron Physics

ISBN: 9780120147649 / Angielski

ISBN: 9780120147649/Angielski

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Ele...
cena: 827,53 zł

 Advances in Imaging and Electron Physics Hawkes, Peter W. 9780120147694 Academic Press
Advances in Imaging and Electron Physics

ISBN: 9780120147694 / Angielski

ISBN: 9780120147694/Angielski

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

  • Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
  • Presents theory...

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagn...

cena: 827,53 zł

 Advances in Imaging and Electron Physics: Volume 139 Hawkes, Peter W. 9780120147816 Academic Press
Advances in Imaging and Electron Physics: Volume 139

ISBN: 9780120147816 / Angielski / Twarda / 306 str.

ISBN: 9780120147816/Angielski/Twarda/306 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
cena: 924,88 zł

 Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction Erni, Rolf 9781848165366 Imperial College Press
Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction

ISBN: 9781848165366 / Angielski / Twarda / 348 str.

ISBN: 9781848165366/Angielski/Twarda/348 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Rolf Erni
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering...
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it a...
cena: 374,82 zł

 Sample Preparation Handbook for Transmission Electron Microscopy: Methodology Ayache, Jeanne 9780387981819 Springer
Sample Preparation Handbook for Transmission Electron Microscopy: Methodology

ISBN: 9780387981819 / Angielski / Twarda / 250 str.

ISBN: 9780387981819/Angielski/Twarda/250 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be...
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen prepara...
cena: 403,47 zł

 Sample Preparation Handbook for Transmission Electron Microscopy: Techniques Ayache, Jeanne 9781441959744 Springer
Sample Preparation Handbook for Transmission Electron Microscopy: Techniques

ISBN: 9781441959744 / Angielski / Twarda / 366 str.

ISBN: 9781441959744/Angielski/Twarda/366 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be...
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen prepara...
cena: 403,47 zł

 Sample Preparation Handbook for Transmission Electron Microscopy Two Volume Set Ayache, Jeanne 9781441960870 Springer
Sample Preparation Handbook for Transmission Electron Microscopy Two Volume Set

ISBN: 9781441960870 / Angielski / Twarda / 670 str.

ISBN: 9781441960870/Angielski/Twarda/670 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil
A comprehensive guide to sample preparation for the transmission electron microscope (TEM). It covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. It guides you through the various techniques for successful sample preparation in fields ranging from materials science to biology.
A comprehensive guide to sample preparation for the transmission electron microscope (TEM). It covers general theoretical and practical aspects of the...
cena: 605,23 zł

 Optical Fluorescence Microscopy: From the Spectral to the Nano Dimension Diaspro, Alberto 9783642151743 Not Avail
Optical Fluorescence Microscopy: From the Spectral to the Nano Dimension

ISBN: 9783642151743 / Angielski / Twarda / 244 str.

ISBN: 9783642151743/Angielski/Twarda/244 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Alberto Diaspro
In the last decade, fluorescence microscopy has evolved from a classical "retrospective" microscopy approach into an advanced imaging technique that allows the observation of cellular activities in living cells with increased resolution and dimensions. A bright new future has arrived as the nano era has placed a whole new array of tools in the hands of biophysicists who are keen to go deeper into the intricacies of how biological systems work. Following an introduction to the complex world of optical microscopy, this book covers topics such as the concept of white confocal, nonlinear optical...
In the last decade, fluorescence microscopy has evolved from a classical "retrospective" microscopy approach into an advanced imaging technique that a...
cena: 605,23 zł

 Aberration-Corrected Analytical Transmission Electron Microscopy Rik Brydson   9780470518519
Aberration-Corrected Analytical Transmission Electron Microscopy

ISBN: 9780470518519 / Angielski / Twarda / 304 str.

ISBN: 9780470518519/Angielski/Twarda/304 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Rik Brydson;¬Abar;¬Abar
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and...
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the ef...
cena: 262,62 zł

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