Deep Centers in Semiconductors
ISBN: 9782881245626 / Angielski / Twarda / 944 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Offering a comprehensive view of research in semiconductor deep centres, this volume examines several key deep centres, all chosen to illustrate a variety of essential concepts. For each deep centre chosen a scientist instrumental in its development discusses the many experimental and theoretical techniques used to achieve the current understanding of that centre. This second edition contains five new sections treating recent developments in the field, including a new chapter on hydrogen in crystalline semiconductors.
Offering a comprehensive view of research in semiconductor deep centres, this volume examines several key deep centres, all chosen to illustrate a var...
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2062,83 zł |
Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, Set
ISBN: 9789814322805 / Angielski / Twarda / 680 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. '... These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.'Foreword by Leonard C Feldman (Director Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, USA)HighlightsAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than...
'... These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry con...
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2202,07 zł |
Microprobe Characterization of Optoelectronic Materials
ISBN: 9781560329411 / Angielski / Twarda / 689 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal...
Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that ...
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2423,83 zł |
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference Held 22-25 March 1999, University of Oxford, UK
ISBN: 9780750306508 / Angielski / Twarda / 774 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigate semiconducting structures. It also covers specimen preparation using focused ion beam milling and advances in microscopy techniques using different types of scanning probes, such as AFM, STM, and SCM. In addition, the book discusses a range of...
With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials p...
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2578,54 zł |
Physics of Semiconductors - Proceedings of the 20th International Conference (in 3 Volumes)
ISBN: 9789810205393 / Angielski / Twarda / 2764 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
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4512,44 zł |
Physics of Semiconductors, the - Proceedings of the 22nd International Conference (in 3 Volumes)
ISBN: 9789810220211 / Angielski / Twarda / 2852 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
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cena:
4667,16 zł |
Synchrotron Light Sources and Free-Electron Lasers: Accelerator Physics, Instrumentation and Science Applications
ISBN: 9783030232009 / Angielski / Twarda / 2509 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. |
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cena:
5000,64 zł |