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 Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations Garg, Rajesh 9781489985101
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

ISBN: 9781489985101 / Angielski / Miękka / 2014 / 212 str.

ISBN: 9781489985101/Angielski/Miękka/2014/212 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Rajesh Garg
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft...
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ...
cena: 443,82 zł

 Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations Garg, Rajesh 9781441909305
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

ISBN: 9781441909305 / Angielski / Twarda / 2009 / 212 str.

ISBN: 9781441909305/Angielski/Twarda/2009/212 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Rajesh Garg; Sunil P. Khatri
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft...
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ...
cena: 605,23 zł

 Affective Computing for Social Good: Enhancing Well-Being, Empathy, and Equity Muskan Garg Rajesh Shardanand Prasad 9783031638206
Affective Computing for Social Good: Enhancing Well-Being, Empathy, and Equity

ISBN: 9783031638206 / Angielski

ISBN: 9783031638206/Angielski

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Muskan Garg; Rajesh Shardanand Prasad
cena: 806,99 zł

 Minimizing and Exploiting Leakage in VLSI Design Nikhil Jayakumar Suganth Paul Rajesh Garg 9781441909497
Minimizing and Exploiting Leakage in VLSI Design

ISBN: 9781441909497 / Angielski / Twarda / 2009 / 214 str.

ISBN: 9781441909497/Angielski/Twarda/2009/214 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Nikhil Jayakumar; Suganth Paul; Rajesh Garg

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in...

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, ...

cena: 605,23 zł

 Minimizing and Exploiting Leakage in VLSI Design Nikhil Jayakumar Suganth Paul Rajesh Garg 9781489985293
Minimizing and Exploiting Leakage in VLSI Design

ISBN: 9781489985293 / Angielski / Miękka / 2014 / 214 str.

ISBN: 9781489985293/Angielski/Miękka/2014/214 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Nikhil Jayakumar;Suganth Paul;Rajesh Garg

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in...

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, ...

cena: 443,82 zł

 
Employees Are Diamonds: The Value of Investing in Your Human Capital

ISBN: 9798392981144 / Angielski

ISBN: 9798392981144/Angielski

Termin realizacji zamówienia: ok. 16-18 dni roboczych (Bez gwarancji dostawy przed świętami)
Rajesh Garg
cena: 24,21 zł

 Hyperglycemia in the Hospital Setting Rajesh K Garg Margo Hudson  9789351523130
Hyperglycemia in the Hospital Setting

ISBN: 9789351523130 / Angielski

ISBN: 9789351523130/Angielski

Termin realizacji zamówienia: ok. 30 dni roboczych (Bez gwarancji dostawy przed świętami)
Rajesh K Garg;Margo Hudson
Hyperglycaemia occurs when people with diabetes have too much sugar in their bloodstream. If blood sugar levels remain high for a length of time, further health complications may occur (Diabetes.co.uk). This book is a concise guide to hyperglycaemia in acutely ill, hospitalised patients. Beginning with an introduction to the epidemiology and pathophysiology of the condition, the following chapters discuss the monitoring of glucose levels and their management. The final sections examine the transition from inpatient to outpatient setting. Written by recognised endocrinologists...
Hyperglycaemia occurs when people with diabetes have too much sugar in their bloodstream. If blood sugar levels remain high for a length of time, furt...
cena: 174,22 zł

 Graph Learning and Network Science for Natural Language Processing Muskan Garg Amit Kumar Gupta Rajesh Prasad 9781032224572
Graph Learning and Network Science for Natural Language Processing

ISBN: 9781032224572 / Angielski

ISBN: 9781032224572/Angielski

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Muskan Garg; Amit Kumar Gupta; Rajesh Prasad
cena: 223,87 zł

 Handbook of Inpatient Endocrinology Rajesh K. Garg, James V. Hennessey, Jeffrey R. Garber 9783031860980
Handbook of Inpatient Endocrinology

ISBN: 9783031860980 / Angielski / Miękka / 2025 / 269 str.

ISBN: 9783031860980/Angielski/Miękka/2025/269 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Managing endocrine diseases in the inpatient setting has become more complex, while transitioning that care back to the ambulatory setting is as critical as ever. This book is intended to serve as an easy-to-navigate and concise text for guidance. A user-friendly, pocket-sized reference for all physicians faced with endocrine care and challenges in hospitalized patients, this handbook covers the most common issues leading to an inpatient endocrine consult, providing differential diagnoses, a reasonable and practical approach to investigating and managing the condition, and advice for...
Managing endocrine diseases in the inpatient setting has become more complex, while transitioning that care back to the ambulatory setting is as criti...
cena: 242,07 zł


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