wyszukanych pozycji: 3
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
ISBN: 9780849394508 / Angielski / Twarda / 1997 / 336 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. Presents scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. From a physics-of-failure perspective, this book explores the temperature effects on electrical parameters of both bipolar and MOSFET devices and identifies models for quantifying temperature effects on package elements.
Presents scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. From a physics-of-failu...
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cena:
596,51 zł |
Mechanical Design of Electronic Systems
ISBN: 9780976241331 / Angielski / Miękka / 2017 / 658 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. This book has been written for engineers to serve as a first text on the packaging of electronic systems. The material has been written for an engineering student or for a practicing professional working as a mechanical or electrical engineer with a company producing electronic products or systems. The engineering student should have completed fundamental courses in the engineering sciences, thermal sciences and materials as prerequisites. The practicing professional will probably be at the early stages of his or her career and be more concerned with the technical details of the design... This book has been written for engineers to serve as a first text on the packaging of electronic systems. The material has been written for an engi... |
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cena:
625,92 zł |
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
ISBN: 9780367400972 / Angielski / Miękka / 2019 / 336 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
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cena:
207,43 zł |