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wyszukanych pozycji: 129
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Applied Scanning Probe Methods XII: Characterization
ISBN: 9783540850380 / Angielski / Twarda / 2008 / 224 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of...
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (...
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cena:
605,23 zł |
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Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 9783642254130 / Angielski / Twarda / 2012 / 630 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning probe microscopy techniques, characterisation of various materials and structures and typical industrial applications.
This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning...
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cena:
605,23 zł |
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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques
ISBN: 9783540262428 / Angielski / Twarda / 2006 / 468 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
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cena:
605,23 zł |
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Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 9783642104961 / Angielski / Twarda / 2011 / 816 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the...
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and com...
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cena:
806,99 zł |
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Katha Panduranga
ISBN: 9789383572793 / Marathi / Miękka / 2015 / 104 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
60,22 zł |
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Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 9783662506011 / Angielski / Miękka / 2016 / 816 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industria...
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cena:
806,99 zł |
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
ISBN: 9783540373155 / Angielski / Twarda / 2006 / 344 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on te...
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cena:
605,23 zł |
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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques
ISBN: 9783642065699 / Angielski / Miękka / 2010 / 420 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
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cena:
443,82 zł |
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Blockchain Technology in Healthcare Applications: Social, Economic, and Technological Implications
ISBN: 9781032123196 / Angielski / Twarda / 2022 / 320 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
707,28 zł |
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Springer Handbook of Nanotechnology
ISBN: 9783662543559 / Angielski / Twarda / 2017 / 1500 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments.
This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates...
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cena:
1210,50 zł |
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Tribology and Mechanics of Magnetic Storage Devices
ISBN: 9780387946276 / Angielski / Twarda / 1996 / 1125 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the multi disciplinary subject of tribology and mechanics of magnetic storage devices. The subject has matured into a rigorous discipline, and many university tribology and mechanics courses now routinely contain material on magnetic storage devices. The major growth in the subject has been on the micro- and nanoscale aspects of tribology and mechanics. Today, most large magnetic storage industries use atomic force microscopes to image the magnetic...
Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the mult...
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cena:
403,47 zł |
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Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications
ISBN: 9783642072130 / Angielski / Miękka / 2010 / 380 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on te...
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cena:
443,82 zł |
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Encyclopedia of Nanotechnology
ISBN: 9789401797795 / Angielski / Twarda / 2016 / 4427 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The second edition of this exhaustive work provides a genuinely international, comprehensive and multi-disciplinary reference encompassing the many diverse topics surrounding the field of nanotechnology. Each entry in the 6-volume set offers a short, self-contained review of the subject matter, written at a level suitable for graduate students, researchers, and practitioners. The first edition of the Encyclopedia introduced a large number of terms, devices and processes related to the multi-disciplinary field of nanotechnology. For the revised 2nd edition, existing entries have been... The second edition of this exhaustive work provides a genuinely international, comprehensive and multi-disciplinary reference encompassing the many... |
cena:
2017,53 zł |
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Modern Tribology Handbook, Two Volume Set
ISBN: 9780849384035 / Angielski / Twarda / 2000 / 1760 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Recent research has led to a deeper understanding of the nature and consequences of interactions between materials on an atomic scale. The results have resonated throughout the field of tribology. For example, new applications require detailed understanding of the tribological process on macro- and microscales and new knowledge guides the rational design of material for these applications. A two volume set, the Modern Tribology Handbook reports on the current state-of-the-field as it reflects these developments, including all industrial applications.In the Modern Tribology Handbook you will...
Recent research has led to a deeper understanding of the nature and consequences of interactions between materials on an atomic scale. The results hav...
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cena:
1414,56 zł |
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Nanotribology and Nanomechanics: An Introduction
ISBN: 9783319846491 / Angielski / Miękka / 2018 / 928 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) For readers with some familiarity with macroscopic tribology, this practical introduction to nanotribology and nanomechanics features research by internationally recognized experts. They integrate the mechanics and materials-science perspectives.
For readers with some familiarity with macroscopic tribology, this practical introduction to nanotribology and nanomechanics features research by inte...
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cena:
524,53 zł |
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Applied Scanning Probe Methods III: Characterization
ISBN: 9783642065965 / Angielski / Miękka / 2010 / 378 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a...
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging wi...
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cena:
443,82 zł |
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Handbook of Micro/Nano Tribology
ISBN: 9780367400170 / Angielski / Miękka / 2020 / 848 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
307,25 zł |
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Scanning Probe Microscopy in Nanoscience and Nanotechnology
ISBN: 9783662502204 / Angielski / Miękka / 2016 / 956 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.
This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive ...
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cena:
1129,80 zł |
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Applied Scanning Probe Methods IV: Industrial Applications
ISBN: 9783540269120 / Angielski / Twarda / 2006 / 284 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rstthere were two the ScanningTunnelingMicroscope, or STM, andtheAtomicForceMic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when itwasplacednearthesample.These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope,...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
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cena:
403,47 zł |
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Bioinspired Water Harvesting, Purification, and Oil-Water Separation
ISBN: 9783030421342 / Angielski / Miękka / 2021 / 232 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
403,47 zł |
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