wyszukanych pozycji: 130
![]() |
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 9783642254130 / Angielski / Twarda / 2012 / 630 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning probe microscopy techniques, characterisation of various materials and structures and typical industrial applications.
This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning...
|
cena:
603,81 |
![]() |
Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications
ISBN: 9783642098727 / Angielski / Miękka / 2010 / 238 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use... The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volu... |
cena:
442,79 |
![]() |
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 9783662506011 / Angielski / Miękka / 2016 / 816 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industria...
|
cena:
805,10 |
![]() |
Applied Scanning Probe Methods IX: Characterization
ISBN: 9783642093418 / Angielski / Miękka / 2010 / 387 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the...
The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applica...
|
cena:
442,79 |
![]() |
Katha Panduranga
ISBN: 9789383572793 / Marathi / Miękka / 2015 / 104 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
59,23 |
![]() |
Introduction to Tribology
ISBN: 9780471158936 / Angielski / Twarda / 2002 / 752 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. Coverage of critical cutting-edge topics including MEMS, nanotribology and magnetic surface storage technologies.
* Integrates the knowledge of tribology from mechanical engineering, mechanics, and materials science points of view. * Covers both the underlying theory and the current applications of tribology to industry. Coverage of critical cutting-edge topics including MEMS, nanotribology and magnetic surface storage technologies.
* Integrates the knowledge of ... |
cena:
808,41 |
![]() |
Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
ISBN: 9783642072116 / Angielski / Miękka / 2010 / 344 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on te...
|
cena:
442,79 |
![]() |
Blockchain Technology in Healthcare Applications: Social, Economic, and Technological Implications
ISBN: 9781032123196 / Angielski / Twarda / 2022 / 320 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
762,24 |
![]() |
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques
ISBN: 9783540262428 / Angielski / Twarda / 2006 / 468 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
|
cena:
603,81 |
![]() |
Springer Handbook of Nanotechnology
ISBN: 9783662543559 / Angielski / Twarda / 2017 / 1500 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments.
This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates...
|
cena:
1207,67 |
![]() |
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 9783642104961 / Angielski / Twarda / 2011 / 816 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the...
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and com...
|
cena:
805,10 |
![]() |
Applied Scanning Probe Methods XII: Characterization
ISBN: 9783540850380 / Angielski / Twarda / 2008 / 224 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of...
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (...
|
cena:
603,81 |
![]() |
Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
ISBN: 9783540373155 / Angielski / Twarda / 2006 / 344 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on te...
|
cena:
603,81 |
![]() |
Encyclopedia of Nanotechnology
ISBN: 9789401797795 / Angielski / Twarda / 2016 / 4427 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The second edition of this exhaustive work provides a genuinely international, comprehensive and multi-disciplinary reference encompassing the many diverse topics surrounding the field of nanotechnology. Each entry in the 6-volume set offers a short, self-contained review of the subject matter, written at a level suitable for graduate students, researchers, and practitioners. The first edition of the Encyclopedia introduced a large number of terms, devices and processes related to the multi-disciplinary field of nanotechnology. For the revised 2nd edition, existing entries have been... The second edition of this exhaustive work provides a genuinely international, comprehensive and multi-disciplinary reference encompassing the many... |
cena:
2012,81 |
![]() |
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques
ISBN: 9783642065699 / Angielski / Miękka / 2010 / 420 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
|
cena:
442,79 |
![]() |
Nanotribology and Nanomechanics: An Introduction
ISBN: 9783319846491 / Angielski / Miękka / 2018 / 928 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. For readers with some familiarity with macroscopic tribology, this practical introduction to nanotribology and nanomechanics features research by internationally recognized experts. They integrate the mechanics and materials-science perspectives.
For readers with some familiarity with macroscopic tribology, this practical introduction to nanotribology and nanomechanics features research by inte...
|
cena:
523,30 |
![]() |
Scanning Probe Microscopy in Nanoscience and Nanotechnology
ISBN: 9783662502204 / Angielski / Miękka / 2016 / 956 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.
This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive ...
|
cena:
1127,15 |
![]() |
Bioinspired Water Harvesting, Purification, and Oil-Water Separation
ISBN: 9783030421342 / Angielski / Miękka / 2021 / 232 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
402,53 |
![]() |
Handbook of Micro/Nano Tribology
ISBN: 9780367400170 / Angielski / Miękka / 2020 / 848 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
329,44 |
![]() |
Principles and Applications of Tribology
ISBN: 9781119944546 / Angielski / Twarda / 2013 / 1006 str. Termin realizacji zamówienia: ok. 30 dni roboczych. In a fully updated edition, 'Principles and Applications to Tribology' gives the solid understanding of tribology which is essential to engineers whilst designing and ensuring the reliability of machine parts and systems.
In a fully updated edition, 'Principles and Applications to Tribology' gives the solid understanding of tribology which is essential to engineers whil...
|
cena:
1024,68 |