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A fully updated version of the popular Introduction to Tribology, the second edition of this leading tribology text introduces the major developments in the understanding and interpretation of friction, wear and lubrication. Considerations of friction and wear have been fully revised to include recent analysis and data work, and friction mechanisms have been reappraised in light of current developments.

In this edition, the breakthroughs in tribology at the nano- and micro- level as well as recent developments in nanotechnology and magnetic storage technologies are...

Although extensive research has been done in this field it still lacks a comprehensive reference work that presents data on properties of different Nanomaterials. This Handbook of Nanomaterials Properties will be the first single reference work that brings together the various properties with wide breadth and scope.

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a...

The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the multi disciplinary subject of tribology and mechanics of magnetic storage devices. The subject has matured into a rigorous discipline, and many university tribology and mechanics courses now routinely contain material on magnetic storage devices. The major growth in the subject has been on the micro- and nanoscale aspects of tribology and mechanics. Today, most large magnetic storage industries use atomic force microscopes to image the magnetic...

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....

The comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts.

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use...

This textbook and comprehensive reference source and serves as a timely, practical introduction to the principles of nanotribology and nanomechanics.

This 4th edition has been completely revised and updated, concentrating on the key measurement techniques, their applications, and theoretical modeling of interfaces. It provides condensed knowledge of the field from the mechanics and materials science perspectives to graduate students, research workers, and practicing engineers.

This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....

'Applied Scanning Probe Methods' examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span many topographic and dynamical surface studies.

This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications.

This comprehensive handbook has become the definitive reference work in the field of nanoscience and nanotechnology, and this 4th edition incorporates a number of recent new developments.

With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VII presents 9 chapters on a variety of new and emerging techniques and refinements of SPM applications.