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 Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 Bhushan, Bharat 9783642104961
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

ISBN: 9783642104961 / Angielski / Twarda / 2011 / 816 str.

ISBN: 9783642104961/Angielski/Twarda/2011/816 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the...
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and com...
cena: 806,99 zł

 Birds of Ramayana Bhushan Bharat 9789383572830
Birds of Ramayana

ISBN: 9789383572830 / Angielski / Miękka / 2016 / 242 str.

ISBN: 9789383572830/Angielski/Miękka/2016/242 str.

Termin realizacji zamówienia: ok. 16-18 dni roboczych (Bez gwarancji dostawy przed świętami)
Bhushan Bharat
cena: 81,73 zł

 Applied Scanning Probe Methods XII: Characterization Bhushan, Bharat 9783540850380
Applied Scanning Probe Methods XII: Characterization

ISBN: 9783540850380 / Angielski / Twarda / 2008 / 224 str.

ISBN: 9783540850380/Angielski/Twarda/2008/224 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Harald Fuchs
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of...
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (...
cena: 605,23 zł

 Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 Bharat Bhushan 9783662507254
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

ISBN: 9783662507254 / Angielski / Miękka / 2016 / 630 str.

ISBN: 9783662507254/Angielski/Miękka/2016/630 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.
With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong sectio...
cena: 605,23 zł

 Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques Bhushan, Bharat 9783540262428
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques

ISBN: 9783540262428 / Angielski / Twarda / 2006 / 468 str.

ISBN: 9783540262428/Angielski/Twarda/2006/468 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Harald Fuchs
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
cena: 605,23 zł

 Introduction to Tribology Bharat Bhushan 9781119944539
Introduction to Tribology

ISBN: 9781119944539 / Angielski / Twarda / 2013 / 744 str.

ISBN: 9781119944539/Angielski/Twarda/2013/744 str.

Termin realizacji zamówienia: ok. 30 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan

A fully updated version of the popular Introduction to Tribology, the second edition of this leading tribology text introduces the major developments in the understanding and interpretation of friction, wear and lubrication. Considerations of friction and wear have been fully revised to include recent analysis and data work, and friction mechanisms have been reappraised in light of current developments.

In this edition, the breakthroughs in tribology at the nano- and micro- level as well as recent developments in nanotechnology and magnetic storage technologies are...

A fully updated version of the popular Introduction to Tribology, the second edition of this leading tribology text introduces the major dev...

cena: 585,08 zł

 Introduction to Biomimetics and Bioinspiration: Materials and Surfaces for Green Science and Technology Bharat Bhushan 9783031623431
Introduction to Biomimetics and Bioinspiration: Materials and Surfaces for Green Science and Technology

ISBN: 9783031623431 / Angielski

ISBN: 9783031623431/Angielski

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
cena: 443,82 zł

 Nanotribology and Nanomechanics: An Introduction Bhushan, Bharat 9783319514321
Nanotribology and Nanomechanics: An Introduction

ISBN: 9783319514321 / Angielski / Twarda / 2017 / 928 str.

ISBN: 9783319514321/Angielski/Twarda/2017/928 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan

This textbook and comprehensive reference source and serves as a timely, practical introduction to the principles of nanotribology and nanomechanics.

This 4th edition has been completely revised and updated, concentrating on the key measurement techniques, their applications, and theoretical modeling of interfaces. It provides condensed knowledge of the field from the mechanics and materials science perspectives to graduate students, research workers, and practicing engineers.


This textbook and comprehensive reference source and serves as a timely, practical introduction to the principles of nanotribology and nanomechanic...

cena: 564,88 zł

 Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques Bhushan, Bharat 9783540373155
Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques

ISBN: 9783540373155 / Angielski / Twarda / 2006 / 344 str.

ISBN: 9783540373155/Angielski/Twarda/2006/344 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Harald Fuchs; Sathoshi Kawata
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on te...
cena: 605,23 zł

 Tribology and Mechanics of Magnetic Storage Devices Bharat Bhushan 9781461275176
Tribology and Mechanics of Magnetic Storage Devices

ISBN: 9781461275176 / Angielski / Miękka / 2011 / 1125 str.

ISBN: 9781461275176/Angielski/Miękka/2011/1125 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the multi- disciplinary subject of tribology and mechanics of magnetic storage devices. The subject has matured into a rigorous discipline, and many university tribology and mechanics courses now routinely contain material on magnetic storage devices. The major growth in the subject has been on the micro- and nanoscale aspects of tribology and mechanics. Today, most large magnetic storage industries use atomic force microscopes to image the magnetic...
Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the mult...
cena: 403,47 zł

 Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques Bhushan, Bharat 9783642065699
Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques

ISBN: 9783642065699 / Angielski / Miękka / 2010 / 420 str.

ISBN: 9783642065699/Angielski/Miękka/2010/420 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Harald Fuchs
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single...
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with ...
cena: 443,82 zł

 Handbook of Nanomaterials Properties Bhushan, Bharat 9783662510483
Handbook of Nanomaterials Properties

ISBN: 9783662510483 / Angielski / Miękka / 2017 / 1463 str.

ISBN: 9783662510483/Angielski/Miękka/2017/1463 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Dan Luo; Scott R. Schricker
Although extensive research has been done in this field it still lacks a comprehensive reference work that presents data on properties of different Nanomaterials. This Handbook of Nanomaterials Properties will be the first single reference work that brings together the various properties with wide breadth and scope.
Although extensive research has been done in this field it still lacks a comprehensive reference work that presents data on properties of different Na...
cena: 2824,56 zł

 Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications Bhushan, Bharat 9783642072130
Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications

ISBN: 9783642072130 / Angielski / Miękka / 2010 / 380 str.

ISBN: 9783642072130/Angielski/Miękka/2010/380 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Harald Fuchs
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes....
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on te...
cena: 443,82 zł

 Tribology and Mechanics of Magnetic Storage Devices Bharat Bhushan 9780387946276
Tribology and Mechanics of Magnetic Storage Devices

ISBN: 9780387946276 / Angielski / Twarda / 1996 / 1125 str.

ISBN: 9780387946276/Angielski/Twarda/1996/1125 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the multi disciplinary subject of tribology and mechanics of magnetic storage devices. The subject has matured into a rigorous discipline, and many university tribology and mechanics courses now routinely contain material on magnetic storage devices. The major growth in the subject has been on the micro- and nanoscale aspects of tribology and mechanics. Today, most large magnetic storage industries use atomic force microscopes to image the magnetic...
Since January 1990, when the first edition ofthis first-of-a-kind book appeared, there has been much experimental and theoretical progress in the mult...
cena: 403,47 zł

 Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 Bharat Bhushan 9783642254130
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

ISBN: 9783642254130 / Angielski / Twarda / 2012 / 630 str.

ISBN: 9783642254130/Angielski/Twarda/2012/630 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning probe microscopy techniques, characterisation of various materials and structures and typical industrial applications.
This text presents the physical and technical foundation of the state of the art in applied scanning probe techniques. The chapters relate to scanning...
cena: 605,23 zł

 Applied Scanning Probe Methods III: Characterization Bhushan, Bharat 9783642065965
Applied Scanning Probe Methods III: Characterization

ISBN: 9783642065965 / Angielski / Miękka / 2010 / 378 str.

ISBN: 9783642065965/Angielski/Miękka/2010/378 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Harald Fuchs
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a...
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging wi...
cena: 443,82 zł

 Katha Panduranga Bharat Bhushan 9789383572793
Katha Panduranga

ISBN: 9789383572793 / Marathi / Miękka / 2015 / 104 str.

ISBN: 9789383572793/Marathi/Miękka/2015/104 str.

Termin realizacji zamówienia: ok. 16-18 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
cena: 60,22 zł

 Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 Bharat Bhushan 9783662506011
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

ISBN: 9783662506011 / Angielski / Miękka / 2016 / 816 str.

ISBN: 9783662506011/Angielski/Miękka/2016/816 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industria...
cena: 806,99 zł

 Modern Tribology Handbook, Two Volume Set Bharat Bhushan 9780849384035
Modern Tribology Handbook, Two Volume Set

ISBN: 9780849384035 / Angielski / Twarda / 2000 / 1760 str.

ISBN: 9780849384035/Angielski/Twarda/2000/1760 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan
Recent research has led to a deeper understanding of the nature and consequences of interactions between materials on an atomic scale. The results have resonated throughout the field of tribology. For example, new applications require detailed understanding of the tribological process on macro- and microscales and new knowledge guides the rational design of material for these applications. A two volume set, the Modern Tribology Handbook reports on the current state-of-the-field as it reflects these developments, including all industrial applications.In the Modern Tribology Handbook you will...
Recent research has led to a deeper understanding of the nature and consequences of interactions between materials on an atomic scale. The results hav...
cena: 1414,56 zł

 Blockchain Technology in Healthcare Applications: Social, Economic, and Technological Implications Bhushan, Bharat 9781032123196
Blockchain Technology in Healthcare Applications: Social, Economic, and Technological Implications

ISBN: 9781032123196 / Angielski / Twarda / 2022 / 320 str.

ISBN: 9781032123196/Angielski/Twarda/2022/320 str.

Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami)
Bharat Bhushan; Nitin Rakesh; Yousef Farhaoui
cena: 707,28 zł

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