ISBN-13: 9786208844189 / Angielski / Miękka / 2025 / 52 str.
Ideally, X-ray diffraction by a crystal produces Dirac peaks at diffraction angles; the graphical representation of diffracted intensity as a function of angle 2 is called a diffraction pattern or diffractogram, or diffraction spectrum.The analysis of diffraction patterns leads to the interpretation of the structures and microstructural properties of crystallized samples. But there are a number of factors influencing peak position, peak width and diffracted intensity, including spectral dispersion, refraction, absorption factor and Lorentz factor.