Kategoria BISAC: Technology & Engineering >> Electronics - Circuits - General

This book addresses the challenges and design trade-offs arising during the hardware design of Faster-than-Nyquist (FTN) signaling transceivers. The authors describe how to design for coexistence between the FTN system described and Orthogonal frequency-division multiplexing (OFDM) systems, enabling readers to design FTN specific processing blocks as add-ons to the conventional transceiver chain.

- Provides a comprehensive introduction to Faster-than-Nyquist (FTN) signaling transceivers, covering both theory and hardware implementation;
- Enables readers to design systems that...

This book presents a complete and accurate study of algebraic circuits, digital circuits whose performance can be associated with any algebraic structure. The authors distinguish between basic algebraic circuits, such as Linear Feedback Shift Registers (LFSRs) and cellular automata and algebraic circuits, such as finite fields or Galois fields.

The book includes a comprehensive review of representation systems, of arithmetic circuits implementing basic and more complex operations and of the residue number systems (RNS). It presents a study of basic algebraic circuits such as LFSRs...

Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and...

This book explores the design of ultra wideband (UWB) technology for wireless body-area networks (WBAN). The authors describe a novel implementation of WBAN sensor nodes that use UWB for data transmission and narrow band for data reception, enabling low power sensor nodes, with high data rate capability. The discussion also includes power efficient, medium access control (MAC) protocol design for UWB based WBAN applications and the authors present a MAC protocol in which a guaranteed delivery mechanism is utilized to transfer data with high priority. Readers will also benefit from this...

This book addresses key aspects of analog integrated circuits and systems design related to system level electrostatic discharge (ESD) protection. It is an invaluable reference for anyone developing systems-on-chip (SoC) and systems-on-package (SoP), integrated with system-level ESD protection. The book focuses on both the design of semiconductor integrated circuit (IC) components with embedded, on-chip system level protection and IC-system co-design. The readers will be enabled to bring the system level ESD protection solutions to the level of integrated circuits, thereby reducing or...

This book introduces a novel transcoding algorithm for real time video applications, designed to overcome inter-operability problems between MPEG-2 to H.264/AVC. The new algorithm achieves 92.8% reduction in the transcoding run time at a price of an acceptable Peak Signal-to-Noise Ratio (PSNR) degradation, enabling readers to use it for real time video applications. The algorithm described is evaluated through simulation and experimental results. In addition, the authors present a hardware implementation of the new algorithm using Field Programmable Gate Array (FPGA) and...

This book covers layout design and layout migration methodologies for optimizing multi-net wire structures in advanced VLSI interconnects. Scaling-dependent models for interconnect power, interconnect delay and crosstalk noise are covered in depth, and several design optimization problems are addressed, such as minimization of interconnect power under delay constraints, or design for minimal delay in wire bundles within a given routing area. A handy reference or a guide for design methodologies and layout automation techniques, this book provides a foundation for physical design challenges...

Fundamentals of Nanoscaled Field Effect Transistors gives comprehensive coverage of the fundamental physical principles and theory behind nanoscale transistors. The specific issues that arise for nanoscale MOSFETs, such as quantum mechanical tunneling and inversion layer quantization, are fully explored. The solutions to these issues, such as high-κ technology, strained-Si technology, alternate devices structures and graphene technology are also given. Some case studies regarding the above issues and solution are also given in the book.

This book provides a unified treatment of Flip-Flop design and selection in nanometer CMOS VLSI systems. The design aspects related to the energy-delay tradeoff in Flip-Flops are discussed, including their energy-optimal selection according to the targeted application, and the detailed circuit design in nanometer CMOS VLSI systems. Design strategies are derived in a coherent framework that includes explicitly nanometer effects, including leakage, layout parasitics and process/voltage/temperature variations, as main advances over the existing body of work in the field. The related design...

This book provides thorough coverage of error correcting techniques. It includes essential basic concepts and the latest advances on key topics in design, implementation, and optimization of hardware/software systems for error correction. The book s chapters are written by internationally recognized experts in this field. Topics include evolution of error correction techniques, industrial user needs, architectures, and design approaches for the most advanced error correcting codes (Polar Codes, Non-Binary LDPC, Product Codes, etc). This book provides access to recent results, and is...

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature...