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Kategorie szczegółowe BISAC

Kategoria BISAC: Science >> Electron Microscopes & Microscopy

ilość książek w kategorii: 212

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 Advances in Imaging and Electron Physics : Calculus of Finite Differences in Quantum Electrodynamics Beate Meffert Henning Harmuth Peter W. Hawkes 9780120147717
Advances in Imaging and Electron Physics : Calculus of Finite Differences in Quantum Electrodynamics

ISBN: 9780120147717 / Angielski / Twarda / 312 str.

ISBN: 9780120147717/Angielski/Twarda/312 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Beate Meffert; Henning Harmuth; Peter W. Hawkes

Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. In particular, the early work of H.F. Harmuth on Maxwell's equations, which was highly controversial at the time, formed a supplement to the series.

This volume, unlike previous volumes in the series concentrates solely on the research of professors' Harmuth and Meffert.

These studies raise important and fundamental questions concerning some of the basic areas of physics: electromagnetic theory and quantum mechanics. They deserve...

Among the subjects reviewed in these Advances, the properties and computation of electromagnetic fields have been considered on several occasions. ...


    
cena: 1829,47 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780120147724
Advances in Imaging and Electron Physics

ISBN: 9780120147724 / Angielski / Twarda / 315 str.

ISBN: 9780120147724/Angielski/Twarda/315 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored...

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagn...


    
cena: 1829,47 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780120147762
Advances in Imaging and Electron Physics

ISBN: 9780120147762 / Angielski / Twarda / 276 str.

ISBN: 9780120147762/Angielski/Twarda/276 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...

    
cena: 1829,47 zł

 Advances in Imaging and Electron Physics : Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics Henning F. Harmuth Beate Meffert 9780120147793
Advances in Imaging and Electron Physics : Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics

ISBN: 9780120147793 / Angielski / Twarda / 319 str.

ISBN: 9780120147793/Angielski/Twarda/319 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Henning F. Harmuth; Beate Meffert
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...

    
cena: 1829,47 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780120147823
Advances in Imaging and Electron Physics

ISBN: 9780120147823 / Angielski / Twarda / 317 str.

ISBN: 9780120147823/Angielski/Twarda/317 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...

    
cena: 937,76 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780120147861
Advances in Imaging and Electron Physics

ISBN: 9780120147861 / Angielski / Twarda / 344 str.

ISBN: 9780120147861/Angielski/Twarda/344 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...

    
cena: 937,76 zł

 Cellular Electron Microscopy J. Richard McIntosh 9780123706478
Cellular Electron Microscopy

ISBN: 9780123706478 / Angielski / Twarda / 850 str.

ISBN: 9780123706478/Angielski/Twarda/850 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
J. Richard McIntosh
Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its description of three-dimensional detail. Cellular Electron Microscopy will help biologists from many disciplines understand modern EM and the value it might bring to their own work. The book's five sections deal with all major issues in EM of cells: specimen preparation, imaging in 3-D, imaging and understanding frozen-hydrated samples, labeling macromolecules, and analyzing EM data. Each chapter was written by scientists who are among...
Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its...

    
cena: 634,36 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780123739070
Advances in Imaging and Electron Physics

ISBN: 9780123739070 / Angielski / Twarda / 240 str.

ISBN: 9780123739070/Angielski/Twarda/240 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...

    
cena: 1829,47 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780123739094
Advances in Imaging and Electron Physics

ISBN: 9780123739094 / Angielski / Twarda / 209 str.

ISBN: 9780123739094/Angielski/Twarda/209 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...

    
cena: 1829,47 zł

 Advances in Imaging and Electron Physics Peter W. Hawkes 9780123739100
Advances in Imaging and Electron Physics

ISBN: 9780123739100 / Angielski / Twarda / 264 str.

ISBN: 9780123739100/Angielski/Twarda/264 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...

    
cena: 937,76 zł

 Advances in Imaging and Electron Physics : Electron Emission Physics Peter W. Hawkes 9780123742070
Advances in Imaging and Electron Physics : Electron Emission Physics

ISBN: 9780123742070 / Angielski / Twarda / 338 str.

ISBN: 9780123742070/Angielski/Twarda/338 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter W. Hawkes
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin...

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...

    
cena: 1048,08 zł

 Advances in Imaging and Electron Physics  9780123742179
Advances in Imaging and Electron Physics

ISBN: 9780123742179 / Angielski / Twarda / 262 str.

ISBN: 9780123742179/Angielski/Twarda/262 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Publication of this 150th volume is an event to be celebrated and, to mark the occasion, the editor...

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...

    
cena: 1829,47 zł

 High-Resolution Transmission Electron Microscopy and Associated Techniques Peter R. Buseck John M. Cowley LeRoy Eyring 9780195042757
High-Resolution Transmission Electron Microscopy and Associated Techniques

ISBN: 9780195042757 / Angielski / Twarda / 670 str.

ISBN: 9780195042757/Angielski/Twarda/670 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter R. Buseck; John M. Cowley; LeRoy Eyring
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled...
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, ener...

    
cena: 2625,03 zł

 Monte Carlo Modeling for Electron Microscopy and Microanalysis David C. Joy 9780195088748
Monte Carlo Modeling for Electron Microscopy and Microanalysis

ISBN: 9780195088748 / Angielski / Twarda / 224 str.

ISBN: 9780195088748/Angielski/Twarda/224 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
David C. Joy
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the...
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for...

    
cena: 2061,51 zł

 Electron Tomography : Methods for Three-Dimensional Visualization of Structures in the Cell Joachim Frank 9780387312347
Electron Tomography : Methods for Three-Dimensional Visualization of Structures in the Cell

ISBN: 9780387312347 / Angielski / Twarda / 456 str.

ISBN: 9780387312347/Angielski/Twarda/456 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Joachim Frank

Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series, with special emphasis on the problems presented by limitations of data collection in the transmission electron microscope. In addition to chapters that are applicable to 3D reconstruction in all fields of science, such as radiological imaging in medicine and electron tomography in materials science,...

Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive w...


    
cena: 964,75 zł

 Biological Low-Voltage Scanning Electron Microscopy James Pawley Heide Schatten 9780387729701
Biological Low-Voltage Scanning Electron Microscopy

ISBN: 9780387729701 / Angielski / Twarda / 344 str.

ISBN: 9780387729701/Angielski/Twarda/344 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
James Pawley; Heide Schatten

Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscope provides narrower probing beams and high electron energy. The result is improved spatial resolution and minimized sample charging and damage. Images produced are less destroyed and have a spatial resolution down to 1.5 nm, three to six times better than conventional SEM.

Although this imaging technique has undergone tremendous developments, it is still poorly...

Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-em...


    
cena: 838,91 zł

 Scanning Probe Microscopy and Spectroscopy : Theory, Techniques, and Applications Dawn A. Bonnell 9780471248248
Scanning Probe Microscopy and Spectroscopy : Theory, Techniques, and Applications

ISBN: 9780471248248 / Angielski / Twarda / 512 str.

ISBN: 9780471248248/Angielski/Twarda/512 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Dawn A. Bonnell
Scanning, tunnelling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. This work covers the fundamental concepts of STM theory, operation, instrumentation and techniques for various applications. It introduces the novice practitioner to the fundamentals, whilst providing experts with a consolidated collection of principles and references.
Scanning, tunnelling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. This work covers the fundamental conce...

    
cena: 1149,69 zł

 Electron Microscopy and Analysis Peter J. Goodhew F. J. Humphreys R. Beanland 9780748409686
Electron Microscopy and Analysis

ISBN: 9780748409686 / Angielski / Miękka / 264 str.

ISBN: 9780748409686/Angielski/Miękka/264 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Peter J. Goodhew; F. J. Humphreys; R. Beanland
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for...
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially...

    
cena: 380,56 zł

 Quantitative Microbeam Analysis A. G. Fitzgerald B. E. Storey D. J. Fabian 9780750302562
Quantitative Microbeam Analysis

ISBN: 9780750302562 / Angielski / Twarda / 350 str.

ISBN: 9780750302562/Angielski/Twarda/350 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
A. G. Fitzgerald; B. E. Storey; D. J. Fabian
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The...
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used t...

    
cena: 1599,70 zł

 Electron Microscopy and Analysis 2003 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003 Stephen McVitie David McComb 9780750309677
Electron Microscopy and Analysis 2003 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003

ISBN: 9780750309677 / Angielski / Twarda / 279 str.

ISBN: 9780750309677/Angielski/Twarda/279 str.

Termin realizacji zamówienia: ok. 5-8 dni roboczych.
Stephen McVitie; David McComb
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the pr...

    
cena: 1268,73 zł

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