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Advances in Imaging and Electron Physics: Volume 144
ISBN: 9780120147861 / Angielski / Twarda / 344 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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856,36 zł |
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Cellular Electron Microscopy: Volume 79
ISBN: 9780123706478 / Angielski / Twarda / 850 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its description of three-dimensional detail. Cellular Electron Microscopy will help biologists from many disciplines understand modern EM and the value it might bring to their own work. The book's five sections deal with all major issues in EM of cells: specimen preparation, imaging in 3-D, imaging and understanding frozen-hydrated samples, labeling macromolecules, and analyzing EM data. Each chapter was written by scientists who are among...
Recent advances in the imaging technique electron microscopy (EM) have improved the method, making it more reliable and rewarding, particularly in its...
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579,30 zł |
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Advances in Imaging and Electron Physics: Volume 148
ISBN: 9780123739100 / Angielski / Twarda / 264 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Elec...
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cena:
856,36 zł |
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Advances in Imaging and Electron Physics: Electron Emission Physics Volume 149
ISBN: 9780123742070 / Angielski / Twarda / 338 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin...
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical a...
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957,11 zł |
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High-Resolution Transmission Electron Microscopy: And Associated Techniques
ISBN: 9780195042757 / Angielski / Twarda / 670 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled...
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, ener...
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426,26 zł |
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Monte Carlo Modeling for Electron Microscopy and Microanalysis
ISBN: 9780195088748 / Angielski / Twarda / 224 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the...
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for...
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805,65 zł |
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 9780306421402 / Angielski / Twarda / 454 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981...
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at L...
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693,97 zł |
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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
ISBN: 9780306435911 / Angielski / Miękka / 407 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new...
During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and micr...
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408,20 zł |
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Electron Microdiffraction
ISBN: 9780306442629 / Angielski / Twarda / 358 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted...
Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful...
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816,44 zł |
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Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 9780306448904 / Angielski / Twarda / 454 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe...
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lu...
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cena:
612,32 zł |
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Introduction to Electron Holography
ISBN: 9780306449208 / Angielski / Twarda / 354 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. This text offers experienced and novice holographers a solid foundation in the theory and practice of holography, the next generation of imaging technology. The guide's how to aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A useful bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences complete the study.
This text offers experienced and novice holographers a solid foundation in the theory and practice of holography, the next generation of imaging techn...
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407,45 zł |
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
ISBN: 9780306472923 / Angielski / Twarda / 689 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled...
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in...
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449,02 zł |
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Biological Electron Microscopy: Theory, Techniques, and Troubleshooting
ISBN: 9780306477492 / Angielski / Twarda / 534 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, light microscopy, physiology, and biochemistry, among other disciplines. It is also presented as a technically demanding discipline operating largely in the sphere of "black boxes" and governed by many absolute laws of procedure. At the introductory level, this portrayal does the discipline and the student a disservice. The instrumentation we use is complex, but ultimately understandable and, more importantly, repairable. The procedures we employ for preparing tissues and cells are...
Electron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, light microscopy, physiology, and bio...
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cena:
489,85 zł |
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Who's Who in Fluorescence
ISBN: 9780387294049 / Angielski / Miękka / 206 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. The Journal of Fluorescence s fourth Who s Who directory is to publish the names, contact details, specialty keywords, and a brief description of scientists employing fluorescence methodology and instrumentation in their working lives. In addition, the directory will provide company contact details with a brief list of fluorescence-related products. The directory will be edited by Chris D. Geddes and Joseph R. Lakowicz, editor and founding editor of the Journal of Fluorescence. "The Journal of Fluorescence s fourth Who s Who directory is to publish the names, contact details, specialty keywords, and a brie... |
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142,84 zł |
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Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell
ISBN: 9780387312347 / Angielski / Twarda / 456 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive work provides a comprehensive treatment of the mathematical background and working methods of three-dimensional reconstruction from tilt series, with special emphasis on the problems presented by limitations of data collection in the transmission electron microscope. In addition to chapters that are applicable to 3D reconstruction in all fields of science, such as radiological imaging in medicine and electron tomography in materials science,... Electron tomography has become a standard technique with applications in cell biology, structural biology, and materials science. This definitive w... |
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938,91 zł |
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
ISBN: 9780387400907 / Angielski / Twarda / 282 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive... Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expa... |
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612,32 zł |
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Biological Low-Voltage Scanning Electron Microscopy
ISBN: 9780387729701 / Angielski / Twarda / 344 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscope provides narrower probing beams and high electron energy. The result is improved spatial resolution and minimized sample charging and damage. Images produced are less destroyed and have a spatial resolution down to 1.5 nm, three to six times better than conventional SEM. Although this imaging technique has undergone tremendous developments, it is still poorly... Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-em... |
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612,32 zł |
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Electron Microscopy and Analysis
ISBN: 9780748409686 / Angielski / Miękka / 264 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for...
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially...
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402,94 zł |
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Quantitative Microbeam Analysis
ISBN: 9780750302562 / Angielski / Twarda / 350 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The...
Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used t...
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cena:
1108,22 zł |
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Electron Microscopy and Analysis 2003 : Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
ISBN: 9780750309677 / Angielski / Twarda / 279 str. Termin realizacji zamówienia: ok. 5-8 dni roboczych. Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the pr...
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cena:
1309,72 zł |
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