• Wyszukiwanie zaawansowane
  • Kategorie
  • Kategorie BISAC
  • Książki na zamówienie
  • Promocje
  • Granty
  • Książka na prezent
  • Opinie
  • Pomoc
  • Załóż konto
  • Zaloguj się

Joseph Goldstein - książki

zaloguj się | załóż konto
Logo Krainaksiazek.pl

koszyk

konto

szukaj
topmenu
Księgarnia internetowa
Szukaj
Książki na zamówienie
Promocje
Granty
Książka na prezent
Moje konto
Pomoc
 
 
Wyszukiwanie zaawansowane
Pusty koszyk
Bezpłatna dostawa dla zamówień powyżej 20 złBezpłatna dostawa dla zamówień powyżej 20 zł

Kategorie główne

• Nauka
 [2950560]
• Literatura piękna
 [1849509]

  więcej...
• Turystyka
 [71097]
• Informatyka
 [151150]
• Komiksy
 [35848]
• Encyklopedie
 [23178]
• Dziecięca
 [617388]
• Hobby
 [139064]
• AudioBooki
 [1657]
• Literatura faktu
 [228597]
• Muzyka CD
 [383]
• Słowniki
 [2855]
• Inne
 [445295]
• Kalendarze
 [1464]
• Podręczniki
 [167547]
• Poradniki
 [480102]
• Religia
 [510749]
• Czasopisma
 [516]
• Sport
 [61293]
• Sztuka
 [243352]
• CD, DVD, Video
 [3414]
• Technologie
 [219456]
• Zdrowie
 [101002]
• Książkowe Klimaty
 [124]
• Zabawki
 [2311]
• Puzzle, gry
 [3459]
• Literatura w języku ukraińskim
 [254]
• Art. papiernicze i szkolne
 [8079]
Kategorie szczegółowe BISAC
 Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Goldstein, Joseph 9781461349693 Springer
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Goldstein, Joseph

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting...

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray...

cena: 442,79
 Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists Goldstein, Joseph 9781461276531 Springer
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

Goldstein, Joseph
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High- resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop- ment of x-ray wavelength and energy dispersive...
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansi...
cena: 402,53
 Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis Goldstein, Joseph 9781461344247 Springer
Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis

Goldstein, Joseph
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market...
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the Unit...
cena: 402,53
 X-Ray Spectrometry in Electron Beam Instruments Joseph Goldstein Dale E. Newbury David B. Williams 9781461357384 Springer
X-Ray Spectrometry in Electron Beam Instruments

Joseph Goldstein Dale E. Newbury David B. Williams
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter...
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrom...
cena: 805,10


Facebook - konto krainaksiazek.pl



Opinie o Krainaksiazek.pl na Opineo.pl

Partner Mybenefit

Krainaksiazek.pl w programie rzetelna firma Krainaksiaze.pl - płatności przez paypal

Czytaj nas na:

Facebook - krainaksiazek.pl
  • książki na zamówienie
  • granty
  • książka na prezent
  • kontakt
  • pomoc
  • opinie
  • regulamin
  • polityka prywatności

Zobacz:

  • Księgarnia czeska

  • Wydawnictwo Książkowe Klimaty

1997-2025 DolnySlask.com Agencja Internetowa

© 1997-2022 krainaksiazek.pl
     
KONTAKT | REGULAMIN | POLITYKA PRYWATNOŚCI | USTAWIENIA PRYWATNOŚCI
Zobacz: Księgarnia Czeska | Wydawnictwo Książkowe Klimaty | Mapa strony | Lista autorów
KrainaKsiazek.PL - Księgarnia Internetowa
Polityka prywatnosci - link
Krainaksiazek.pl - płatnośc Przelewy24
Przechowalnia Przechowalnia