Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

ISBN-13: 9781461276531 / Angielski / Miękka / 2011 / 840 str.

Joseph Goldstein; Dale E. Newbury; Patrick Echlin

Opis

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High- resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop- ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

Recenzje

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal

Spis treści

Introduction. Electron Optics. Electron Scattering. Image Formation and Interpretation. X-Ray Spectral Measurement. Qualitative X-Ray Analysis. X-Ray Peak and Background Measurements. Quantitative X-Ray Analysis, The Basics. Quantitative X-Ray Analysis. Compositional Imaging. Specimen Preparation for Inorganic Materials. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials. Coating and Conductivity Techniques for SEM and Microanalysis. Database Index.

O autorze

Joseph Goldstein leitet seit 1974 weltweit Retreats und Seminare in buddhistischer Meditation und ist Mitbegründer der Insight Meditation Society.
Seine Praxis begann er 1967, als er als Friedensaktivist in Thailand auf den Buddhismus stieß. Heute gilt er als einer der führenden Vertreter eines westlichen Buddhismus. In deutscher Sprache wurde von ihm (gemeinsam mit Jack Kornfield) das Buch Einsicht durch Meditation veröffentlicht.