Advancing miniaturization, higher integration, reduced supply voltage and other changing parameters of modern integrated digital logic devices lead to situations where fault effects, that previously were an issue only in extremely harsh environments, e.g. as seen in space missions, are now impacting the circuits also in normal environments. The diverging trend - increasing complexity vs. decreasing reliability - is getting a serious problem for high reliability applications. In particular if a repair is very expensive or even impossible, the trend goes towards adaptive systems that can...