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Kategorie szczegółowe BISAC
 Germanium-Based Technologies: From Materials to Devices Claeys, Cor 9780080449531 Elsevier Science
Germanium-Based Technologies: From Materials to Devices

Claeys, Cor

Germanium is a semiconductor material that formed the basis for the development of transistor technology. Although the breakthrough of planar technology and integrated circuits put silicon in the foreground, in recent years there has been a renewed interest in germanium, which has been triggered by its strong potential for deep submicron (sub 45 nm) technologies. Germanium-Based technologies: From Materials to Devices is the first book to provide a broad, in-depth coverage of the field, including recent advances in Ge-technology and the fundamentals in material science, device...

Germanium is a semiconductor material that formed the basis for the development of transistor technology. Although the breakthrough of planar techn...

cena: 705,83 zł
 Extended Defects in Germanium: Fundamental and Technological Aspects Claeys, Cor 9783540856115 Springer
Extended Defects in Germanium: Fundamental and Technological Aspects

Claeys, Cor
Intends to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distinguish harmful from less detrimental defects and should point out ways for defect engineering and control.
Intends to provide a fundamental understanding of the extended-defect formation during Ge materials and device processing, providing ways to distingui...
cena: 605,23 zł
 Extended Defects in Germanium: Fundamental and Technological Aspects Claeys, Cor 9783642099212 Not Avail
Extended Defects in Germanium: Fundamental and Technological Aspects

Claeys, Cor
The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, twins and defects (two-dimensional defects) and precipitates, bubbles, etc. The first part covers fundamentals, describing the crystallographic structure and other physical and electrical properties, mainly of dislocations. Since dislocations are essential for the plastic deformation of Germanium, methods for analysis and imaging of dislocations and to evaluate their structure are described. Attention is given to the electrical and optical...
The aim is to give an overview of the physics of extended defects in Germanium, i.e. dislocations (line defects), grain boundaries, stacking faults, t...
cena: 605,23 zł
 Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact Claeys, Cor 9783319939247 Springer
Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact

Claeys, Cor
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
cena: 685,93 zł
 Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact Claeys, Cor 9783030067472 Springer
Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact

Claeys, Cor
cena: 685,93 zł


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