In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.

This volume contains review articles written by the invited speakers at the eighth International Summer Institute in Surface Science (ISISS 1987), held at the University of Wisconsin-Milwaukee in August of 1987. During the course of ISISS, invited speakers, all internationally recognized experts in the various fields of surface science, present tutorial review lectures. In addition, these experts are asked to write review articles on their lecture topic. Former ISISS speakers serve as advisors concerning the selection of speakers and lecture topics. Em phasis is given to those areas which...

The articles collected in this volume give a broad overview of the current state of surface science. Pioneers in the field and researchers met together at this Solvay Conference to discuss important new developments in surface science, with an emphasis on the common area between solid state physics and physical chemistry. The contributions deal with the following subjects: structure of surfaces, surface science and catalysis, two-dimensional physics and phase transitions, scanning tunneling microscopy, surface scattering and surface dynamics, chemical reactions at surfaces, solid-solid...

This book is a collection of selected papers presented at the First Interna- ti onal Conference on the Structure of Surfaces (ICSOS-1). ICSOS-1 was hel d on the Berkeley campus of the University of California during August 13-16, 1984. The International Organizing Committee members were: S.Y. Tong (Chairman), M.A. Van Hove (Vice-Chairman), D.A. King (Secretary), D.J. Chadi (Treasurer), D.L. Adams, A.M. Bradshaw, M.J. Cardillo, J.E. Demuth, J. Eckert, G. Ertl, B.I. Lundqvist, J.B. Pendry, Y. Petroff, M. Simonetta, J.R. Smith, G.A. Somorjai, J. Stohr, R. Ueda, and X.D. Xie. The series of ICSOS...

It is now firmly established that various adsorptive and catalytic processes taking place on the surface of semiconductors and in MIS structures strongly influence their electronic properties and hence modify the parameters of semi conductor devices. The inverse problem of how the semiconductor's electronic subsystem influences adsorption and dissociation of molecules at the surface has been recognized but much less explored. The main purpose of the present book is to generalize the experimental data and explain the relationship be tween these two classes of phenomena. We also discuss...

This book deals with the latest achievements in the field of optical coherent microscopy. While many other books exist on microscopy and imaging, this book provides a unique resource dedicated solely to this subject. Similarly, many books describe applications of holography, interferometry and speckle to metrology but do not focus on their use for microscopy. The coherent light microscopy reference provided here does not focus on the experimental mechanics of such techniques but instead is meant to provide a users manual to illustrate the strengths and capabilities of developing techniques....

This book collects together selected papers presented at the Second Interna- tional Conference on the Structure of Surfaces (ICSOS-II). The conference was held at the Royal Thopical Institute in Amsterdam, The Netherlands, June 22-25, 1987. It was held in part to celebrate the 25th anniversary of the NEVAC (Netherlands Vacuum Society). The International Organizing Committee members were: M. A. Van Hove (Chairman) J. F. van der Veen (Vice-Chairman) W. F. van der Weg (Treasurer) D. L. Adams A. M. Bradshaw M. J. Cardillo D. J. Chadi J. E. Demuth J. Eckert G. Ertl S. Ino D. A. King B. I....

This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles...