New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.
SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the...
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-ch...
Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). More than just an historical overview, this book will assess previous and present approaches related to scaling the gate dielectric and their impact, along with the creative directions and forthcoming challenges that will define the future of gate dielectric scaling technology.
Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductor...
This book provides a survey of the state of the art of technology and future trends in the new family of Smart Power ICs and describes design and applications in a variety of fields ranging from automotive to telecommunications, reliability evaluation and qualification procedures. The book is a valuable source of information and reference for both power IC design specialists and to all those concerned with applications, the development of digital circuits and with system architecture.
This book provides a survey of the state of the art of technology and future trends in the new family of Smart Power ICs and describes design and appl...
This book provides a rather comprehensive presentation of the physics and modeling of high-frequency bipolar transistors with particular emphasis given to silicon-based devices. I hope it will be found useful by those who do as well as by those who intend to work in the field, as it compiles and extends material presented in numerous publications in a coherent fashion. I've worked on this project for years and did my best to avoid errors. De- spite all efforts it is possible that "something" has been overlooked during copy-editing and proof-reading. If you find a mistake please let me know....
This book provides a rather comprehensive presentation of the physics and modeling of high-frequency bipolar transistors with particular emphasis give...
The VLSI memory era truly began when the first production of semiconduc- tor memory was announced by IBM and Intel in 1970. The announcement had a profound impact on my research at Hitachi Ltd., and I was forced to change fields: from magnetic thin film to semiconductor memory. This change was so exceptionally sudden and difficult, I feIt like a victim of fate. Looking back, however, I realize how fortunate I was. I have witnessed an unprecedented increase in memory capacity (DRAM, for example, has had a 6-order increase in the last three decades - from the 1-Kb level in 1970 to the 1-Gb...
The VLSI memory era truly began when the first production of semiconduc- tor memory was announced by IBM and Intel in 1970. The announcement had a pro...
Gettering Defects in Semiconductors fulfills three basic purposes:
- to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics;
- to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists;
- to fill a gap in the contemporary literature on the underlying semiconductor-material theory.
The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international...
Gettering Defects in Semiconductors fulfills three basic purposes:
- to systematize the experience and research in exploiting various gettering ...
This first comprehensive account of high-dynamic-range (HDR) vision focuses on HDR real-time, high-speed digital video recording and also systematically presents HDR video transmission and display. While the book conveys the overall picture of HDR vision, specific knowledge of microelectronics and image processing is not required. In this book, experts share their knowledge in this rapidly evolving art related to the single most powerful of our senses.
This first comprehensive account of high-dynamic-range (HDR) vision focuses on HDR real-time, high-speed digital video recording and also systemati...
Since scaling of CMOS is reaching the nanometer area serious limitations enforce the introduction of novel materials, device architectures and device concepts. Multi-gate devices employing high-k gate dielectrics are considered as promising solution overcoming these scaling limitations of conventional planar bulk CMOS. Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies provides a technology oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies.
Since scaling of CMOS is reaching the nanometer area serious limitations enforce the introduction of novel materials, device architectures and devi...
In the last 7 years, the ?rst edition of "Lock-in Thermography" has established as a reference book for all users of this technique for investigating electronic devices, especially solar cells. At this time, a vital further development of lock-in therm- raphy could be observed. Not only the experimental technique was improved by applying new and better infrared cameras, solid immersion lenses, and novel t- ing strategies, but also completely new application ?elds of lock-in thermography were established by implying irradiation of light during the measurements. The two groups of new techniques...
In the last 7 years, the ?rst edition of "Lock-in Thermography" has established as a reference book for all users of this technique for investigating ...
