Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumption, and in many scaled technologies leakage contributes 30-50% of the overall power consumption under nominal operating conditions. Leakage is important in a variety of different contexts. For example, in desktop applications, active leakage power (i.e., leakage power when the processor is...
Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of tran...
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device...
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditio...
Written by the world's most prominent microprocessor design leaders from industry and academia, this book provides complete coverage of all aspects of complex microprocessor design: technology, power management, clocking, high-performance architecture, design methodologies, memory and I/O design, computer aided design, testing and design for testability. The chapters provide state-of-the-art knowledge while including sufficient tutorial material to bring non-experts up to speed. A useful companion to design engineers working in related areas.
Written by the world's most prominent microprocessor design leaders from industry and academia, this book provides complete coverage of all aspects...
This volume provides a complete understanding of the fundamental causes of routing congestion in present-day and next-generation VLSI circuits, offers techniques for estimating and relieving congestion, and provides a critical analysis of the accuracy and effectiveness of these techniques. The book includes metrics and optimization techniques for routing congestion at various stages of the VLSI design flow. The subjects covered include an explanation of why the problem of congestion is important and how it will trend, plus definitions of metrics that are appropriate for measuring...
This volume provides a complete understanding of the fundamental causes of routing congestion in present-day and next-generation VLSI circuits, off...
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one...
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in...
transconductance e?ciency of all critical devices in order to reduce the n- essary bias current. However, reducing the current density also results in a severely decreased device f . An optimization of the current density is re- T quired to provide the correct balance between transconductance e?ciency and bandwidth. Plots such as Figure 2. 1 are useful tools for designers when choosing appropriate transistor bias points. Technology scaling allows greatly increased f realization for a given IC. Thus, weak inversion biasing for RF T design will become increasingly useful in future technology...
transconductance e?ciency of all critical devices in order to reduce the n- essary bias current. However, reducing the current density also results in...
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed to:
-Meet the needs of a rapidly growing mobile cell phone market -Offset a significant increase in the power dissipation of high-end microprocessor units.
Low power large capacity memories are a necessary component of low voltage LSIs. Many challenges arise in the process of achieving such memories as their devices and voltages are scaled down below 100nm and sub-1-V. A high signal-to-noise (S/N) ratio design is necessary to deal with small signal voltages from low-voltage...
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed to:
Although energy dissipation has improved with each new technology node, because SoCs are integrating tens of million devices on-chip, the energy ex pended per operation has become a critical consideration in digital and ana log integrated circuits. The focus of this book is sub-threshold circuit design, which involves scaling voltages below the device thresholds. In this region, the energy per operation cair be reduced by an order of magnitude compared to conventional operation but at the cost of circuit performance. In many emerging applications such as self-powered RFID, wireless sensors...
Although energy dissipation has improved with each new technology node, because SoCs are integrating tens of million devices on-chip, the energy ex pe...
Abstraction Refinement for Large Scale Model Checking summarizes recent research on abstraction techniques for model checking large digital system. Considering both the size of today's digital systems and the capacity of state-of-the-art verification algorithms, abstraction is the only viable solution for the successful application of model checking techniques to industrial-scale designs. This book describes recent research developments in automatic abstraction refinement techniques. The suite of algorithms presented in this book has demonstrated significant improvement over prior art; some...
Abstraction Refinement for Large Scale Model Checking summarizes recent research on abstraction techniques for model checking large digital system. Co...
This book provides a complete overview of the field of carbon nanotube electronics. It covers materials and physical properties, synthesis and fabrication processes, devices and circuits, modeling, and finally novel applications of nanotube-based electronics. The book introduces fundamental device physics and circuit concepts of 1-D electronics. At the same time it provides specific examples of the state-of-the-art nanotube devices.
This book provides a complete overview of the field of carbon nanotube electronics. It covers materials and physical properties, synthesis and fabr...
