Nonlinear Problems in Accelerator Physics contains the proceedings of the International Workshop on Nonlinear Problems in Accelerator Physics. Consisting only of invited papers, the book focuses on resolving problems associated with nonlinear effects-essential for the development of the next generation of particle accelerators. It facilitates an understanding of accelerator optical systems. Topics covered include Hamiltonian dynamics (such as CHAOS), computer codes for design of focusing systems, and spectrometers. The book is of interest to researchers in high energy, nuclear, electron, ion...

The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory,...

X-Ray Lasers 1996 provides not only an overview and progress report on this fast moving field, but also important reference material on which future work can be built. Topics covered include collisional x-ray lasers, table-top x-ray lasers, beam optics, x-ray optics, OFI and photo-pumped schemes, capillary schemes, international laser facilities, XUV nonlinear mixing, alternative soft x-ray sources, diagnostics, and applications. The volume is an essential addition to the libraries of researchers in the field.

Multinary compounds are used in a wide range of devices including photovoltaic solar cells, light emitters and detectors and piezoelectric actuators. This conference provides a forum for scientists and engineers working on fundamental and applied aspects of these materials.

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses...

Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application...

In these proceedings of the conference of October 2002, contributors describe their research on computational tools and algorithms related to the simulation of modern particle accelerators and particle optical devices. Individual paper topics include accuracy analysis of a 2D Poisson-Vlasov PIC solver and estimates of the collision effects in space

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

Held every three years, The International Symposia on the Science and Technology of Light Sources (LS) provide a unique forum for the international community of engineers, scientists, research organizations, and academia from the lighting industry. In Light Sources 2004, leaders in their respective fields discuss the latest findings and exciting developments in light source research. Contributors provide valuable analyses and discussions on topics such as incandescent and halogen sources, fluorescent discharge sources, lamp-related electronic gear, high intensity discharge sources,...

Electron and Photon Impact Ionization and Related Topics 2004 provides an overview of the latest advances in the field of ionization by electron and photon impact. The book contains 18 contributions of recent experimental, theoretical, and computational work on correlated processes that involve a wide range of targets, including atoms, molecules, clusters, and surfaces. It covers a broad range of current topics, such as multi-particle coincidence studies, in particular, (e,2e) and (e,3e) processes, photoionization with or without excitation, and multiphoton single and double ionization. Three...