• Wyszukiwanie zaawansowane
  • Kategorie
  • Kategorie BISAC
  • Książki na zamówienie
  • Promocje
  • Granty
  • Książka na prezent
  • Opinie
  • Pomoc
  • Załóż konto
  • Zaloguj się

Książka:  » książki  » Frontiers in Electronic Testing

zaloguj się | załóż konto
Logo Krainaksiazek.pl

koszyk

konto

szukaj
topmenu
Księgarnia internetowa
Szukaj
Książki na zamówienie
Promocje
Granty
Książka na prezent
Moje konto
Pomoc
 
 
Wyszukiwanie zaawansowane
Pusty koszyk
Bezpłatna dostawa dla zamówień powyżej 20 złBezpłatna dostawa dla zamówień powyżej 20 zł

Kategorie główne

• Nauka
 [2946600]
• Literatura piękna
 [1856966]

  więcej...
• Turystyka
 [72221]
• Informatyka
 [151456]
• Komiksy
 [35826]
• Encyklopedie
 [23190]
• Dziecięca
 [619653]
• Hobby
 [140543]
• AudioBooki
 [1577]
• Literatura faktu
 [228355]
• Muzyka CD
 [410]
• Słowniki
 [2874]
• Inne
 [445822]
• Kalendarze
 [1744]
• Podręczniki
 [167141]
• Poradniki
 [482898]
• Religia
 [510455]
• Czasopisma
 [526]
• Sport
 [61590]
• Sztuka
 [243598]
• CD, DVD, Video
 [3423]
• Technologie
 [219201]
• Zdrowie
 [101638]
• Książkowe Klimaty
 [124]
• Zabawki
 [2473]
• Puzzle, gry
 [3898]
• Literatura w języku ukraińskim
 [254]
• Art. papiernicze i szkolne
 [8170]
Kategorie szczegółowe BISAC
 
Test Resource Partitioning for System-on-a-Chip

Vikram Iyengar;Anshuman Chandra

Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of...

Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play ...

cena: 403,47 zł
 
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici;Bashir M. Al-Hashimi

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.


This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th...

cena: 403,47 zł
 
Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Hans-Joachim Wunderlich

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on...

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use...

cena: 403,47 zł
 
Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault

Hans-Joachim Wunderlich

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on...

Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use...

cena: 403,47 zł


Facebook - konto krainaksiazek.pl



Opinie o Krainaksiazek.pl na Opineo.pl

Partner Mybenefit

Krainaksiazek.pl w programie rzetelna firma Krainaksiaze.pl - płatności przez paypal

Czytaj nas na:

Facebook - krainaksiazek.pl
  • książki na zamówienie
  • granty
  • książka na prezent
  • kontakt
  • pomoc
  • opinie
  • regulamin
  • polityka prywatności

Zobacz:

  • Księgarnia czeska

  • Wydawnictwo Książkowe Klimaty

1997-2025 DolnySlask.com Agencja Internetowa

© 1997-2022 krainaksiazek.pl
     
KONTAKT | REGULAMIN | POLITYKA PRYWATNOŚCI | USTAWIENIA PRYWATNOŚCI
Zobacz: Księgarnia Czeska | Wydawnictwo Książkowe Klimaty | Mapa strony | Lista autorów
KrainaKsiazek.PL - Księgarnia Internetowa
Polityka prywatnosci - link
Krainaksiazek.pl - płatnośc Przelewy24
Przechowalnia Przechowalnia