I had great pleasure in reading Philippe Refregier's book on the theory of noise and its applications in physics. The main aim of the book is to present the basic ideas used to characterize these unwanted random signals that obscure information content. To this end, the author devotes a sigificant part of his book to a detailed study of the probabilistic foundations of fluctuation theory. Following a concise and accurate account of the basics of probability the ory, the author includes a detailed study of stochastic processes, emphasizing the idea of the correlation function, which plays a...
I had great pleasure in reading Philippe Refregier's book on the theory of noise and its applications in physics. The main aim of the book is to prese...
Observations and physical concepts are interwoven to give basic explanations of phenomena and also show the limitations in these explanations and identify some fundamental questions.
Compared to conventional plasma physics textbooks this book focuses on the concepts relevant in the large-scale space plasmas. It combines basic concepts with current research and new observations in interplanetary space and in the magnetospheres.
Graduate students and young researchers starting to work in this special field of science, will find the numerous references to...
Observations and physical concepts are interwoven to give basic explanations of phenomena and also show the limitations in these explanations and i...
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker...
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconduct...