wyszukanych pozycji: 2
Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications
ISBN: 9780367576257 / Angielski / Miękka / 2020 / 336 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
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cena:
239,93 zł |
Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications
ISBN: 9781466581777 / Angielski / Twarda / 2013 / 336 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples. Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is... Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the p... |
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cena:
912,96 zł |