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wyszukanych pozycji: 6
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
ISBN: 9781475781427 / Angielski / Miękka / 2013 / 690 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a...
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, ...
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cena:
524,53 |
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Neural Models and Algorithms for Digital Testing
ISBN: 9781461367673 / Angielski / Miękka / 2012 / 184 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9....
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Ten...
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cena:
403,47 |
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Concurrent and Comparative Discrete Event Simulation
ISBN: 9780792394112 / Angielski / Twarda / 1993 / 186 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no...
Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for w...
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cena:
403,47 |
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
ISBN: 9780792379911 / Angielski / Twarda / 2000 / 690 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a...
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, ...
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cena:
524,53 |
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Neural Models and Algorithms for Digital Testing
ISBN: 9780792391654 / Angielski / Twarda / 1991 / 184 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9....
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Ten...
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cena:
403,47 |
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Unified Methods for VLSI Simulation and Test Generation
ISBN: 9780792390251 / Angielski / Twarda / 1989 / 148 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) |
cena:
403,47 |
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