wyszukanych pozycji: 2
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
ISBN: 9781441923073 / Angielski / Miękka / 2011 / 408 str. Termin realizacji zamówienia: ok. 20 dni roboczych. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker...
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconduct...
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cena:
349,38 zł |
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
ISBN: 9780387400921 / Angielski / Twarda / 2004 / 428 str. Termin realizacji zamówienia: ok. 20 dni roboczych. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker...
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconduct...
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cena:
504,67 zł |