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This book is a concise but thorough introduction to the tools commonly used in pattern recognition and machine learning, including classification, dimensionality reduction, regression, and clustering, as well as recent popular topics such as deep neural networks and Gaussian process regression. The Second Edition is thoroughly revised, featuring a new chapter on the emerging topic of physics-informed machine learning and additional material on deep neural networks.

Combining theory and practice, this book is suitable for the graduate or advanced undergraduate...

This book is the first of its kind to discuss error estimation with a model-based approach. From the basics of classifiers and error estimators to distributional and Bayesian theory, it covers important topics and essential issues pertaining to the scientific validity of pattern classification.

Error Estimation for Pattern Recognition focuses on error estimation, which is a broad and poorly understood topic that reaches all research areas using pattern classification. It includes model-based approaches and discussions of newer error estimators such as bolstered and Bayesian...