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wyszukanych pozycji: 12
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Bias Temperature Instability for Devices and Circuits
ISBN: 9781461479086 / Angielski / Twarda / 2013 / 810 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bi...
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cena:
602,40 |
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Hot Carrier Degradation in Semiconductor Devices
ISBN: 9783319359120 / Angielski / Miękka / 2016 / 517 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reli... |
cena:
321,26 |
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Noise in Nanoscale Semiconductor Devices
ISBN: 9783030374990 / Angielski / Twarda / 2020 / 729 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) |
cena:
522,07 |
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Bias Temperature Instability for Devices and Circuits
ISBN: 9781493955299 / Angielski / Miękka / 2016 / 810 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior.
This book provides a reference to one of the more challenging reliability issues plaguing modern semiconductor technologies. It introduces a new defe...
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cena:
441,75 |
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Simulation of Semiconductor Processes and Devices 2007: Sispad 2007
ISBN: 9783211728604 / Angielski / Mixed media product / 2007 / 463 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) The "Twelfth International Conference on Simulation of Semiconductor Processes and Devices" (SISPAD 2007) continues a long series of conferences and is held in September 2007 at the TU Wien, Vienna, Austria. The conference is the leading forum for Technology Computer-Aided Design (TCAD) held alternatingly in the United States, Japan, and Europe. The first SISPAD conference took place in Tokyo in 1996 as the successor to three preceding conferences NUPAD, VPAD, and SISDEP. With its longstanding history SISPAD provides a world-wide forum for the presenta tion and discussion of outstanding...
The "Twelfth International Conference on Simulation of Semiconductor Processes and Devices" (SISPAD 2007) continues a long series of conferences and i...
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cena:
602,40 |
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Hot Carrier Degradation in Semiconductor Devices
ISBN: 9783319089935 / Angielski / Twarda / 2014 / 517 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reli... |
cena:
441,75 |
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Simulation of Semiconductor Processes and Devices 2007: Sispad 2007
ISBN: 9783709119112 / Angielski / Miękka / 2017 / 463 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) The "Twelfth International Conference on Simulation of Semiconductor Processes and Devices" (SISPAD 2007) continues a long series of conferences and is held in September 2007 at the TU Wien, Vienna, Austria. The conference is the leading forum for Technology Computer-Aided Design (TCAD) held alternatingly in the United States, Japan, and Europe. The first SISPAD conference took place in Tokyo in 1996 as the successor to three preceding conferences NUPAD, VPAD, and SISDEP. With its longstanding history SISPAD provides a world-wide forum for the presenta- tion and discussion of outstanding...
The "Twelfth International Conference on Simulation of Semiconductor Processes and Devices" (SISPAD 2007) continues a long series of conferences and i...
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cena:
602,40 |
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Noise in Nanoscale Semiconductor Devices
ISBN: 9783030375027 / Angielski / Miękka / 2021 / 729 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) |
cena:
361,42 |
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Advanced Device Modeling and Simulation
ISBN: 9789812386076 / Angielski / Twarda / 2003 / 216 str. Termin realizacji zamówienia: ok. 30 dni roboczych (Dostawa w 2026 r.) Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as far as possible results in extremely small devices which can no longer be described using simple analytical models. This book covers various aspects of advanced device modeling and simulation. As such it presents extensive reviews and original research by outstanding scientists. The bulk of the book is concerned with the theory of classical and quantum-mechanical transport modeling, based on macroscopic, spherical harmonics and Monte Carlo methods.
Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as far as possible results in extremely s...
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cena:
547,81 |
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Miniaturized Transistors
ISBN: 9783039210107 / Angielski / Miękka / 2019 / 202 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych (Dostawa w 2026 r.) |
cena:
242,89 |
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Miniaturized Transistors, Volume II
ISBN: 9783036541693 / Angielski / Twarda / 2022 / 352 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych (Dostawa w 2026 r.) |
cena:
408,68 |
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Organic Electronics
ISBN: 9783642045370 / Angielski / Twarda / 2009 / 330 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Dostawa w 2026 r.) Dear Readers, Since the ground-breaking, Nobel-prize crowned work of Heeger, MacDiarmid, and Shirakawa on molecularly doped polymers and polymers with an alternating bonding structure at the end of the 1970s, the academic and industrial research on hydrocarbon-based semiconducting materials and devices has made encouraging progress. The strengths of semiconducting polymers are currently mainly unfolding in cheap and easily assembled thin ?lm transistors, light emitting diodes, and organic solar cells. The use of so-called "plastic chips" ranges from lightweight, portable devices over...
Dear Readers, Since the ground-breaking, Nobel-prize crowned work of Heeger, MacDiarmid, and Shirakawa on molecularly doped polymers and polymers with...
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cena:
1204,83 |
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