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wyszukanych pozycji: 3
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Scanning Transmission Electron Microscopy: Imaging and Analysis
ISBN: 9781441971999 / Angielski / Twarda / 2011 / 762 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present... Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the ... |
cena:
846,23 zł |
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Characterization of High Tc Materials and Devices by Electron Microscopy
ISBN: 9780521031707 / Angielski / Miękka / 2006 / 408 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron...
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading e...
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cena:
271,54 zł |
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Characterization of High Tc Materials and Devices by Electron Microscopy
ISBN: 9780521554909 / Angielski / Twarda / 2000 / 406 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron...
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading e...
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cena:
663,32 zł |
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