wyszukanych pozycji: 2
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
ISBN: 9781643279107 / Angielski / Twarda / 2015 / 66 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
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cena:
655,68 zł |
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
ISBN: 9781681740249 / Angielski / Miękka / 2015 / 66 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. The study of dark matter, in both astrophysics and particle physics, has emerged as one of the most active and exciting topics of research in recent years. This book reviews the history behind the discovery of missing mass (or unseen mass) in the Universe, and ties this into the proposed extensions to the Standard Model of Particle Physics (such as Supersymmetry), which were being proposed within the same time frame. This book is written as an introduction to these problems at the forefront of astrophysics and particle physics, with the goal of conveying the physics of dark matter to...
The study of dark matter, in both astrophysics and particle physics, has emerged as one of the most active and exciting topics of research in recent y...
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cena:
191,24 zł |