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This book considers the following problems in the domain of test and reliability of SRAM memories: optimizing test flow using stress conditions; statistical simulation for very low probabilities; variability analysis of an SRAM test-chip; fault tolerance in random addressed memories. Although the problems considered are all related to SRAM, some solutions found may also be applied in other domains. The Monte-carlo based simulation method described here is a general purpose method. The fault tolerance technique proposed can be used in different kind of memories, and its mathematical...