wyszukanych pozycji: 2
Nanometer-Scale Defect Detection Using Polarized Light
ISBN: 9781848219366 / Angielski / Twarda / 2016 / 316 str. Termin realizacji zamówienia: ok. 22 dni roboczych. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the... This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and inte...
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cena:
758,67 zł |
Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method
ISBN: 9781786306876 / Angielski / Twarda / 2021 / 288 str. Termin realizacji zamówienia: ok. 22 dni roboczych. |
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cena:
753,21 zł |