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This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to...

In this work, CuxOy and ZnO: Al thin films on plain glass substrates have been deposited as single thin films for property characterization by reactive DC Magnetron Sputtering and evaporation techniques using an Edward Auto 306 Magnetron Sputtering System respectively. A CuxOy-ZnO: Al p-n junction was fabricated by reactive DC magnetron sputtering and reactive thermal evaporation technique on a glass slide with silver as contacts. Transmittance and reflectance data in the range 300 nm-2500 nm were obtained using UV-VIS NIR Spectrophotometer Solid State 3700 DUV for all the thin films samples...