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A major objective of this book is to fill the gap between traditional logic design principles and logic design/optimization techniques used in practice. Over the last two decades several techniques for computer-aided design and optimization of logic circuits have been developed. However, underlying theories of these techniques are inadequately covered or not covered at all in undergraduate text books. This book covers not only the "classical" material found in current text books but also selected materials that modern logic designers need to be familiar with.

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration...