wyszukanych pozycji: 4
Reliability and Degradation of III-V Optical Devices
ISBN: 9780890066522 / Angielski / Twarda / 1996 / 372 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism ...
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cena:
774,49 zł |
Reliability of Semiconductor Lasers and Optoelectronic Devices
ISBN: 9780128192542 / Angielski / Miękka / 2021 / 336 str. Termin realizacji zamówienia: ok. 8-10 dni roboczych (Dostawa przed świętami) |
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cena:
712,36 zł |
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ISBN: 9781461443360 / Angielski / Twarda / 2012 / 616 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for... Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability proc... |
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cena:
1170,03 zł |
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
ISBN: 9781493901197 / Angielski / Miękka / 2014 / 616 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for... Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability proc... |
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cena:
1170,03 zł |