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wyszukanych pozycji: 4
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Soft Errors in Modern Electronic Systems
ISBN: 9781441969927 / Angielski / Twarda / 2010 / 318 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment... This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualif... |
cena:
576,96 zł |
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Soft Errors in Modern Electronic Systems
ISBN: 9781461426899 / Angielski / Miękka / 2012 / 318 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment... This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualif... |
cena:
576,96 zł |
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On-Line Testing for VLSI
ISBN: 9780792381327 / Angielski / Twarda / 1998 / 160 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of... Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func...
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cena:
384,63 zł |
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On-Line Testing for VLSI
ISBN: 9781441950338 / Angielski / Miękka / 2010 / 160 str. Termin realizacji zamówienia: ok. 20 dni roboczych. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of... Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func...
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cena:
384,63 zł |
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