wyszukanych pozycji: 3
Properties of Advanced Semiconductor Materials : GaN, AIN, InN, BN, SiC, SiGe
ISBN: 9780471358275 / Angielski / Twarda / 2001 / 216 str. Termin realizacji zamówienia: ok. 30 dni roboczych. Containing the most reliable parameter values for each of these semiconductor materials, along with applicable references, these data are organized in a structured, logical way for each semiconductor material.
* Reviews traditional semiconductor materials as well as new, advanced semiconductors. * Essential authoritative handbook on the properties of semiconductor materials. Containing the most reliable parameter values for each of these semiconductor materials, along with applicable references, these data are organized in...
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cena:
728,86 |
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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
ISBN: 9781402021688 / Angielski / Twarda / 2004 / 368 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation... A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport a... |
cena:
1219,01 |
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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
ISBN: 9781402021695 / Angielski / Miękka / 2004 / 368 str. Termin realizacji zamówienia: ok. 30 dni roboczych. A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation... A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport a... |
cena:
1301,95 |