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wyszukanych pozycji: 4
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 9780387465463 / Angielski / Twarda / 2007 / 328 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of the highest possible quality. Testing in general and...
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contrib...
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cena:
806,99 zł |
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Thermal and Power Management of Integrated Circuits
ISBN: 9780387257624 / Angielski / Twarda / 2006 / 192 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device... In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditio... |
cena:
403,47 zł |
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Thermal and Power Management of Integrated Circuits
ISBN: 9781441938329 / Angielski / Miękka / 2010 / 182 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device... In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditio... |
cena:
403,47 zł |
 |
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 9781441942852 / Angielski / Miękka / 2010 / 328 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of the highest possible quality. Testing in general and...
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contrib...
|
cena:
806,99 zł |
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